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7MBP150RTB-060 PDF预览

7MBP150RTB-060

更新时间: 2022-01-19 01:15:00
品牌 Logo 应用领域
其他 - ETC 双极性晶体管
页数 文件大小 规格书
23页 1085K
描述
7 IPM IGBT

7MBP150RTB-060 数据手册

 浏览型号7MBP150RTB-060的Datasheet PDF文件第17页浏览型号7MBP150RTB-060的Datasheet PDF文件第18页浏览型号7MBP150RTB-060的Datasheet PDF文件第19页浏览型号7MBP150RTB-060的Datasheet PDF文件第20页浏览型号7MBP150RTB-060的Datasheet PDF文件第22页浏览型号7MBP150RTB-060的Datasheet PDF文件第23页 
a
Test  
cate-  
gories  
Number Accept-  
Reference norms  
EIAJ  
Test items  
Test methods and conditions  
of  
ance  
ED-4701  
sample number  
Test Method 101  
1 High temperature Test temp.  
reverse bias  
: Ta = 125 ±5℃  
(Tj 150 )  
: VC = 0.8×VCES  
: Applied DC voltage to C-E  
Vcc = 15V  
: 1000 hr.  
: 85 ±2 ℃  
: 85 ±5 %  
: VC = 0.8×VCES  
Vcc = 15V  
: Applied DC voltage to C-E  
: 1000 hr.  
: 2 sec.  
: 18 sec.  
: D  
Tj=100 ±5deg  
5
5
5
( 1 : 0 )  
( 1 : 0 )  
( 1 : 0 )  
Bias Voltage  
Bias Method  
高温逆アス  
Test duration  
Test temp.  
Relative humidity  
Bias Voltage  
Test Method 102  
Condition code C  
2 Temperature  
humidity bias  
高温高湿アス  
Bias Method  
Test duration  
ON time  
OFF time  
Test temp.  
Test Method 106  
3 Intermitted  
operating life  
(Power cycle)  
断続動作  
Tj 150 , Ta=25 ±5℃  
Number of cycles  
: 15000 cycles  
19.Failure Criteria  
Item  
Characteristic  
Symbol  
Failure criteria  
Lower limit Upper limit  
Unit  
Note  
Electrical  
Leakage current  
ICES  
-
USL×2  
mA  
V
characteristic Saturation voltage  
Forward voltage  
VCE(sat)  
-
USL×1.2  
USL×1.2  
USL×1.2  
USL×1.2  
USL×1.2  
USL×1.2  
USL×1.2  
VF  
th(j-c)  
-
V
/W  
/W  
Thermal  
IGBT  
FWD  
-
th(j-c)  
Ioc  
resistance  
-
Over Current Protection  
Alarm signal hold time  
Over heating Protection  
LSL×0.8  
LSL×0.8  
LSL×0.8  
tALM  
ms  
TcOH  
Isolation voltage  
Visual inspection  
Peeling  
Viso  
Broken insulation  
-
Visual  
inspection  
-
The visual sample  
-
Plating  
and the others  
LSL : Lower specified limit.  
USL : Upper specified limit.  
Note :  
Each parameter measurement read-outs shall be made after stabilizing the components at room  
ambient for 2 hours minimum, 24 hours maximum after removal from the tests. And in case of the  
wetting tests, for example, moisture resistance tests, each component shall be made wipe or dry  
completely before the measurement.  
a
Fuji Electric Co.,Ltd.  
MS6M0657  
21/23  
H04-004-03  

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