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74ACT11021DR PDF预览

74ACT11021DR

更新时间: 2024-12-01 02:58:47
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德州仪器 - TI 输入元件
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描述
DUAL 4-INPUT POSITIVE-AND GATES

74ACT11021DR 数据手册

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54ACT11021, 74ACT11021  
DUAL 4-INPUT POSITIVE-AND GATES  
SCAS012B – D2957, JULY 1987 – REVISED APRIL 1993  
54ACT11021 . . . J PACKAGE  
74ACT11021 . . . D OR N PACKAGE  
(TOP VIEW)  
Inputs Are TTL-Voltage Compatible  
Flow-Through Architecture Optimizes  
PCB Layout  
Center-Pin V  
and GND Configurations  
Minimize High-Speed Switching Noise  
1B  
1A  
NC  
1C  
1D  
V
CC  
1
2
3
4
5
6
7
14  
13  
12  
11  
1Y  
EPIC (Enhanced-Performance Implanted  
CMOS) 1- m Process  
GND  
2Y  
CC  
10 2A  
500-mA Typical Latch-Up Immunity at 125°C  
2D  
9
8
2B  
Package Options Include Plastic Small-  
Outline Packages, Ceramic Chip Carriers,  
and Standard Plastic and Ceramic 300-mil  
DIPs  
2C  
NC  
54ACT11021 . . . FK PACKAGE  
(TOP VIEW)  
description  
These devices contain two independent 4-input  
AND gates. They perform the Boolean functions  
Y = A B C D or Y = A + B + C + D in positive logic.  
3
2
1
20 19  
18  
2B  
NC  
NC  
1B  
4
5
6
7
8
NC  
NC  
NC  
2C  
17  
16  
15  
14  
The 54ACT11021 is characterized for operation  
over the full military temperature range of 55°C  
to 125°C. The 74ACT11021 is characterized for  
operation from – 40°C to 85°C.  
NC  
1A  
9 10 11 12 13  
FUNCTION TABLE  
(each gate)  
INPUTS  
OUTPUT  
Y
NC – No internal connection  
A
H
L
B
C
H
X
X
L
D
H
X
X
X
L
H
X
L
H
L
L
L
L
logic diagram (positive logic)  
X
X
X
1A  
1B  
1C  
1D  
X
X
1Y  
X
2A  
2B  
2C  
2D  
logic symbol  
2Y  
2
1A  
&
1
1B  
3
1Y  
2Y  
13  
1C  
12  
1D  
10  
2A  
9
2B  
5
7
2C  
6
2D  
This symbol is in accordance with ANSI/IEEE Std 91-1984  
and IEC Publication 617-12.  
Pin numbers shown are for the D, J, and N packages.  
EPIC is a trademark of Texas Instruments Incorporated.  
PRODUCTION DATA information is current as of publication date. Products  
conform to specifications per the terms of Texas Instruments standard  
warranty. Production processing does not necessarily include testing of all  
parameters.  
Copyright 1993, Texas Instruments Incorporated  
2–1  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

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