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71V2556S200PF8

更新时间： 2024-11-16 20:50:39
品牌 Logo 应用领域
艾迪悌 - IDT 时钟静态存储器内存集成电路
页数 文件大小 规格书
28页 536K
描述
ZBT SRAM, 128KX36, 3.2ns, CMOS, PQFP100

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中文翻译

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71V2556S200PF8 技术参数

是否Rohs认证： 不符合生命周期：Obsolete
包装说明：QFP, QFP100,.63X.87Reach Compliance Code：not_compliant
风险等级：5.92最长访问时间：3.2 ns
最大时钟频率 (fCLK)：200 MHzI/O 类型：COMMON
JESD-30 代码：R-PQFP-G100JESD-609代码：e0
内存密度：4718592 bit内存集成电路类型：ZBT SRAM
内存宽度：36湿度敏感等级：3
端子数量：100字数：131072 words
字数代码：128000工作模式：SYNCHRONOUS
最高工作温度：70 °C最低工作温度：
组织：128KX36输出特性：3-STATE
封装主体材料：PLASTIC/EPOXY封装代码：QFP
封装等效代码：QFP100,.63X.87封装形状：RECTANGULAR
封装形式：FLATPACK并行/串行：PARALLEL
电源：2.5,3.3 V认证状态：Not Qualified
最大待机电流：0.04 A最小待机电流：3.14 V
子类别：SRAMs最大压摆率：0.4 mA
表面贴装：YES技术：CMOS
温度等级：COMMERCIAL端子面层：Tin/Lead (Sn85Pb15)
端子形式：GULL WING端子节距：0.635 mm
端子位置：QUADBase Number Matches：1

71V2556S200PF8 数据手册

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128K x 36, 256K x 18  
IDT71V2556S  
IDT71V2558S  
IDT71V2556SA  
IDT71V2558SA  
3.3V Synchronous ZBT™ SRAMs  
2.5V I/O, Burst Counter  
Pipelined Outputs  
Features  
cycle,andtwocycleslatertheassociateddatacycleoccurs,beitread  
or write.  
The IDT71V2556/58 contain data I/O, address and control signal  
registers.Outputenableistheonlyasynchronoussignalandcanbeused  
todisabletheoutputsatanygiventime.  
AClockEnable(CEN)pinallowsoperationoftheIDT71V2556/58to  
besuspendedaslongasnecessary.Allsynchronousinputsareignored  
when(CEN)ishighandtheinternaldeviceregisterswillholdtheirprevious  
values.  
Therearethreechipenablepins(CE1,CE2,CE2)thatallowtheuser  
to deselect the device when desired. If any one of these three are not  
assertedwhenADV/LDislow,nonewmemoryoperationcanbeinitiated.  
However,anypendingdatatransfers(readsorwrites)willbecompleted.  
Thedatabuswilltri-statetwocyclesafterchipisdeselectedorawriteis  
initiated.  
TheIDT71V2556/58hasanon-chipburstcounter.Intheburstmode,  
theIDT71V2556/58canprovidefourcyclesofdataforasingleaddress  
presentedtotheSRAM.Theorderoftheburstsequenceisdefinedbythe  
LBOinputpin.TheLBOpinselectsbetweenlinearandinterleavedburst  
sequence. The ADV/LD signal is used to load a new external address  
(ADV/LD = LOW) or increment the internal burst counter (ADV/LD =  
HIGH).  
The IDT71V2556/58 SRAMs utilize IDT's latest high-performance  
CMOSprocessandarepackagedinaJEDECstandard14mmx20mm  
100-pinthinplasticquadflatpack(TQFP)aswellasa119ballgridarray  
(BGA) and a 165 fine pitch ball grid array (fBGA).  
◆
128K x 36, 256K x 18 memory configurations  
◆
Supports high performance system speed - 200 MHz  
(3.2 ns Clock-to-Data Access)  
ZBTTM Feature - No dead cycles between write and read  
◆
cycles  
◆
Internally synchronized output buffer enable eliminates the  
need to control OE  
◆
Single R/W (READ/WRITE) control pin  
◆
Positive clock-edge triggered address, data, and control  
signal registers for fully pipelined applications  
4-word burst capability (interleaved or linear)  
Individual byte write (BW1 - BW4) control (May tie active)  
Three chip enables for simple depth expansion  
3.3V power supply (±5%), 2.5V I/O Supply (VDDQ)  
Optional - Boundary Scan JTAG Interface (IEEE 1149.1  
◆
◆
◆
◆
◆
complaint)  
◆
Packaged in a JEDEC standard 100-pin plastic thin quad  
flatpack (TQFP), 119 ball grid array (BGA) and 165 fine pitch  
ball grid array (fBGA)  
Description  
TheIDT71V2556/58 are3.3Vhigh-speed4,718,592-bit(4.5Mega-  
bit)synchronousSRAMS.Theyaredesignedtoeliminatedeadbuscycles  
when turning the bus around between reads and writes, or writes and  
TM  
reads. Thus, they have been given the name ZBT , or Zero Bus  
Turnaround.  
AddressandcontrolsignalsareappliedtotheSRAMduringoneclock  
PinDescriptionSummary  
0
17  
A -A  
Address Inputs  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Output  
Input  
Input  
I/O  
Synchronous  
Synchronous  
Asynchronous  
Synchronous  
Synchronous  
Synchronous  
N/A  
Chip Enables  
1
2
2
CE , CE , CE  
Output Enable  
OE  
R/W  
CEN  
Read/Write Signal  
Clock Enable  
Individual Byte Write Selects  
Clock  
1
2
3
4
BW , BW , BW , BW  
CLK  
ADV/LD  
LBO  
Advance burst address / Load new address  
Linear / Interleaved Burst Order  
Test Mode Select  
Test Data Input  
Synchronous  
Static  
TMS  
TDI  
Synchronous  
Synchronous  
N/A  
TCK  
TDO  
TRST  
ZZ  
Te s t Clo c k  
Te s t Data Outp ut  
Synchronous  
Asynchronous  
Synchronous  
Synchronous  
Static  
JTAG Reset (Optional)  
Sleep Mode  
0
31  
P1  
P4  
I/O -I/O , I/O -I/O  
Data Input / Output  
Core Power, I/O Power  
Ground  
DD DDQ  
V
, V  
Supply  
Supply  
SS  
V
Static  
4875 tbl 01  
OCTOBER 2004  
1
©2004IntegratedDeviceTechnology,Inc.  
DSC-4875/08  
1234567...28

中文翻译

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与71V2556S200PF8相关器件

型号 品牌 获取价格 描述 数据表
71V2556S200PFG IDT

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 		ZBT SRAM, 128KX36, 3.2ns, CMOS, PQFP100, 20 X 14 MM, 1.40 MM HEIGHT, ROHS COMPLIANT, PLAST
71V2556SA100BGG IDT

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 		3.3V Synchronous ZBT SRAMs
71V2556SA100BGG8 IDT

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 		3.3V Synchronous ZBT SRAMs
71V2556SA100BGGI IDT

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 		3.3V Synchronous ZBT SRAMs
71V2556SA100BGGI8 IDT

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 		3.3V Synchronous ZBT SRAMs
71V2556SA100BQ IDT

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 		ZBT SRAM, 128KX36, 5ns, CMOS, PBGA165, 13 X 15 MM, FPBGA-165
71V2556SA100BQ8 IDT

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 		SRAM
71V2556SA100BQGI IDT

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 		ZBT SRAM, 128KX36, 5ns, CMOS, PBGA165, 15 X 13 MM, ROHS COMPLIANT, FBGA-165
71V2556SA100BQGI8 IDT

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 		ZBT SRAM, 128KX36, 5ns, CMOS, PBGA165
71V2556SA100PFG IDT

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 		3.3V Synchronous ZBT SRAMs

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