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71T016SA10PHGI8 PDF预览

71T016SA10PHGI8

更新时间: 2024-02-02 23:40:48
品牌 Logo 应用领域
艾迪悌 - IDT 静态存储器内存集成电路
页数 文件大小 规格书
9页 99K
描述
TSOP-44, Reel

71T016SA10PHGI8 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete零件包装代码:TSOP
包装说明:,针数:44
Reach Compliance Code:compliant风险等级:5.83
JESD-609代码:e3内存集成电路类型:STANDARD SRAM
湿度敏感等级:3峰值回流温度(摄氏度):260
端子面层:Matte Tin (Sn)处于峰值回流温度下的最长时间:NOT SPECIFIED
Base Number Matches:1

71T016SA10PHGI8 数据手册

 浏览型号71T016SA10PHGI8的Datasheet PDF文件第3页浏览型号71T016SA10PHGI8的Datasheet PDF文件第4页浏览型号71T016SA10PHGI8的Datasheet PDF文件第5页浏览型号71T016SA10PHGI8的Datasheet PDF文件第7页浏览型号71T016SA10PHGI8的Datasheet PDF文件第8页浏览型号71T016SA10PHGI8的Datasheet PDF文件第9页 
IDT71T016SA, 2.5V CMOS Static RAM  
1 Meg (64K x 16-Bit)  
Commercial and Industrial Temperature Ranges  
Timing Waveform of Read Cycle No. 2(1)  
tRC  
ADDRESS  
tAA  
tOH  
OE  
(3)  
tOHZ  
tOE  
(3)  
tOLZ  
CS  
(2)  
tACS  
(3)  
(3)  
tCHZ  
tCLZ  
BLE  
BHE,  
(2)  
(3)  
tBE  
tBHZ  
(3)  
tBLZ  
DATAOUT  
DATA OUTVALID  
5326 drw 07  
NOTES:  
1. WE is HIGH for Read Cycle.  
2. AddressmustbevalidpriortoorcoincidentwiththelaterofCS,BHE,orBLE transitionLOW;otherwisetAA isthelimitingparameter.  
3. Transitionismeasured±200mVfromsteadystate.  
Timing Waveform of Write Cycle No. 1 (WE Controlled Timing)(1,2,4)  
tWC  
ADDRESS  
tAW  
CS  
(2)  
(5)  
(5)  
tCW  
tCHZ  
tBHZ  
tBW  
BHE , BLE  
WE  
tWR  
tWP  
tAS  
(5)  
tWHZ  
(5)  
tOW  
tDH  
(3)  
DATAOUT  
PREVIOUS DATA VALID  
DATA VALID  
tDW  
DATAIN  
DATAIN VALID  
5326 drw 08  
NOTES:  
1. A write occurs during the overlap of a LOW CS, LOW BHE or BLE, and a LOW WE.  
2. OEis continuouslyHIGH. IfduringaWE controlledwrite cycleOEis LOW, tWP mustbe greaterthanorequaltotWHZ+tDW toallowthe I/Odrivers toturnoffanddata tobe placed  
onthe bus forthe requiredtDW. IfOEis HIGHduringaWEcontrolledwrite cycle, this requirementdoes notapplyandthe minimumwrite pulse is as shortas the specifiedtWP.  
3. Duringthis period,I/Opins areintheoutputstate,andinputsignals mustnotbeapplied.  
4. IftheCSLOWorBHEandBLELOWtransitionoccurssimultaneouslywithoraftertheWELOWtransition,theoutputsremaininahigh-impedancestate.  
5. Transitionismeasured±200mVfromsteadystate.  
6.42  
6

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