IDT71342SA/LA
High-Speed 4K x 8 Dual-Port Static RAM with Semaphore
Industrial and Commercial Temperature Ranges
Data Retention Characteristics
(LA Version Only) VLC = 0.2V, VHC = VCC - 0.2V
Symbol
Parameter
Test Condition
Min.
Typ.(1)
Max.
Unit
V
___
___
VDR
VCC for Data Retention
2.0
___
I
CCDR
Data Retention Current
V
CC = 2V, CE > VHC
COM'L. & IND.
100
1500
µA
ns
(3)
CDR
___
___
t
Chip Deselect to Data Retention Time
Operation Recovery Time
0
SEM > VHC
IN > VHC or < VLC
(3)
(2)
___
___
tR
V
t
RC
ns
2721 tbl 07
NOTES:
1. VCC = 2V, TA = +25°C, and are not production tested.
2. tRC = Read Cycle Time.
3. This parameter is guaranteed by device characterization, but is not production tested.
Data Rention Waveform
DATA RETENTION MODE
DR > 2V
VCC
4.5V
4.5V
V
t
CDR
tR
VDR
CE
VIH
VIH
2721 drw 04
AC Test Conditions
Input Pulse Levels
GND to 3.0V
5ns
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
1.5V
1.5V
Figures 1 and 2
2721 tbl 08
+5V
+5V
1250Ω
1250Ω
DATAOUT
775Ω
DATAOUT
775Ω
5pF *
30pF
,
,
2721 drw 05
2721 drw 06
Figure 1. AC Output Test Load
Figure 2. Output Test Load
(for tLZ, tHZ, tWZ, tOW)
*Including scope and jig
5
6.42