5秒后页面跳转
70V261 PDF预览

70V261

更新时间: 2023-12-20 18:44:53
品牌 Logo 应用领域
瑞萨 - RENESAS /
页数 文件大小 规格书
19页 258K
描述
16K x 16 3.3V Dual-Port RAM w/Int

70V261 数据手册

 浏览型号70V261的Datasheet PDF文件第3页浏览型号70V261的Datasheet PDF文件第4页浏览型号70V261的Datasheet PDF文件第5页浏览型号70V261的Datasheet PDF文件第7页浏览型号70V261的Datasheet PDF文件第8页浏览型号70V261的Datasheet PDF文件第9页 
70V261S/L  
High-Speed 16K x 16 Dual-Port Static RAM with Interrupt  
Industrial and Commercial Temperature Ranges  
3.3V  
3.3V  
AC Test Conditions  
Input Pulse Levels  
GND to 3.0V  
3ns Max.  
1.5V  
590Ω  
590Ω  
Input Rise/Fall Times  
Input Timing Reference Levels  
Output Reference Levels  
Output Load  
DATAOUT  
BUSY  
INT  
DATAOUT  
1.5V  
30pF  
5pF*  
435Ω  
435Ω  
Figures 1 and 2  
3040 tbl 10  
3040 drw 04  
3040 drw 03  
Figure 1. AC Output Test Load  
Figure 2. Output Test Load  
(for tLZ, tHZ, tWZ, tOW)  
* Including scope and jig.  
Timing of Power-Up Power-Down  
CE  
tPU  
tPD  
ICC  
ISB  
3040 drw 05  
AC Electrical Characteristics Over the  
OperatingTemperatureandSupplyVoltageRange(4)  
70V261X25  
70V261X55  
Com'l Only  
70V261X35  
Com'l Only  
Com'l  
& Ind  
Symbol  
Parameter  
Min.  
Max.  
Min.  
Max.  
Min.  
Max.  
Unit  
READ CYCLE  
____  
____  
____  
t
RC  
AA  
ACE  
ABE  
AOE  
OH  
LZ  
HZ  
PU  
PD  
SOP  
SAA  
Read Cycle Time  
25  
35  
55  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
____  
____  
____  
t
Address Access Time  
25  
25  
25  
35  
35  
35  
55  
55  
55  
Chip Enable Access Time(3)  
____  
____  
____  
____  
____  
____  
____  
____  
____  
t
t
Byte Enable Access Time(3)  
t
Output Enable Access Time  
15  
20  
30  
____  
____  
____  
t
Output Hold from Address Change  
Output Low-Z Time(1,2)  
3
3
3
____  
____  
____  
t
3
3
3
Output High-Z Time(1,2)  
15  
20  
25  
____  
____  
____  
t
t
Chip Enable to Power Up Time(2)  
Chip Disable to Power Down Time(2)  
Semaphore Flag Update Pulse (OE or SEM)  
Semaphore Address Access Time  
0
0
0
____  
____  
____  
____  
____  
____  
t
25  
35  
50  
____  
____  
____  
t
15  
15  
15  
____  
____  
____  
t
35  
45  
65  
ns  
3040 tbl 11  
NOTES:  
1. Transition is measured 0mV from Low- or High-impedance voltage with Output Test Load (Figure 2).  
2. This parameter is guaranteed by device characterization, but is not production tested.  
3. To access RAM, CE = VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL.  
4. 'X' in part number indicates power rating (S or L).  
6.642  
Jun.04.21  

与70V261相关器件

型号 品牌 描述 获取价格 数据表
70V261L25PF IDT TQFP-100, Tray

获取价格

70V261L25PFG IDT HIGH-SPEED 3.3V 16K x 16 DUAL-PORT STATIC RAM

获取价格

70V261L25PFG8 IDT HIGH-SPEED 3.3V 16K x 16 DUAL-PORT STATIC RAM

获取价格

70V261L25PFGI IDT HIGH-SPEED 3.3V 16K x 16 DUAL-PORT STATIC RAM

获取价格

70V261L25PFGI8 IDT HIGH-SPEED 3.3V 16K x 16 DUAL-PORT STATIC RAM

获取价格

70V261L25PFI8 IDT TQFP-100, Reel

获取价格