R
QPRO XQ4000XL Series QML High-Reliability FPGAs
XQ4000XL RAM Synchronous (Edge-Triggered) Write Operation Guidelines
Testing of switching parameters is modeled after testing
methods specified by MIL-M-38510/605. All devices are
100% functionally tested. Internal timing parameters are
derived from measuring internal test patterns. Listed below
are representative values. For more specific, more precise,
and worst-case guaranteed data, use the values reported
by the static timing analyzer (TRCE in the Xilinx Develop-
ment System) and back-annotated to the simulation netlist.
All timing parameters assume worst-case operating condi-
tions (supply voltage and junction temperature). Values
apply to all XQ4000XL devices and are expressed in nano-
seconds unless otherwise noted.
Single-Port RAM Synchronous (Edge-Triggered) Write Operation Characteristics
-3
-1
Symbol
Single Port RAM
Size
Min
Max
Min
Max
Units
Write Operation
T
Address write cycle time (clock K period)
Clock K pulse width (active edge)
Address setup time before clock K
Address hold time after clock K
16x2
32x1
16x2
32x1
16x2
32x1
16x2
32x1
16x2
32x1
16x2
32x1
16x2
32x1
16x2
32x1
16x2
32x1
9.0
9.0
4.5
4.5
2.2
2.2
0
-
7.7
7.7
3.9
3.9
1.7
1.7
0
-
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
WCS
T
-
-
WCTS
T
-
-
WPS
T
-
-
WPTS
T
-
-
ASS
T
-
-
ASTS
T
-
-
AHS
T
0
-
0
-
AHTS
T
D
D
setup time before clock K
hold time after clock K
2.0
2.5
0
-
1.7
2.1
0
-
DSS
IN
IN
T
-
-
DSTS
T
-
-
DHS
T
0
-
0
-
DHTS
T
WE setup time before clock K
WE hold time after clock K
Data valid after clock K
2.0
1.8
0
-
-
1.6
1.5
0
-
-
WSS
T
T
T
WSTS
T
-
-
WHS
0
-
0
-
WHTS
T
-
6.8
8.1
-
5.8
6.9
WOS
-
-
WOTS
Read Operation
T
Address read cycle time
16x2
32x1
16x2
32x1
16x2
32x1
4.5
6.5
-
-
-
2.6
3.8
-
-
-
ns
ns
ns
ns
ns
ns
RC
T
RCT
T
Data valid after address change (no Write Enable)
Address setup time before clock K
1.6
2.7
-
1.3
2.2
-
ILO
IHO
ICK
T
T
-
-
1.1
2.2
0.9
1.7
T
-
-
IHCK
8
www.xilinx.com
1-800-255-7778
DS029 (v1.3) June 25, 2000
Product Specification