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5962-9669104HYX PDF预览

5962-9669104HYX

更新时间: 2023-02-15 00:00:00
品牌 Logo 应用领域
WEDC 静态存储器
页数 文件大小 规格书
8页 101K
描述
Standard SRAM, 128KX8, 70ns, CMOS, CDIP32, SIDE BRAZED, CERAMIC, DIP-32

5962-9669104HYX 数据手册

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WMS128K8-XXX  
AC CHARACTERISTICS  
(VCC = 5.0V, TA = -55°C To +125°C)  
Parameter  
Read Cycle  
Symbol  
-70  
-85  
-100  
-120  
Units  
Min  
Max  
Min  
Max  
Min  
Max  
Min  
Max  
Read Cycle Time  
tRC  
tAA  
70  
85  
100  
120  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address Access Time  
70  
85  
100  
120  
Output Hold from Address Change  
Chip Select Access Time  
tOH  
3
3
3
3
tACS  
70  
35  
85  
45  
100  
50  
120  
60  
Output Enable to Output Valid  
Chip Select to Output in Low Z  
Output Enable to Output in Low Z  
Chip Disable to Output in High Z  
Output Disable to Output in High Z  
tOE  
tCLZ1  
tOLZ1  
tCHZ1  
tOHZ1  
5
5
5
5
5
5
5
5
25  
25  
25  
25  
35  
35  
35  
35  
1. This parameter is guaranteed by design but not tested.  
AC CHARACTERISTICS  
(VCC = 5.0V, TA = -55°C To +125°C)  
Parameter  
Symbol  
-70  
-85  
-100  
-120  
Units  
Write Cycle  
Min  
70  
60  
60  
30  
50  
0
Max  
Min  
85  
75  
75  
35  
55  
0
Max  
Min  
100  
80  
80  
40  
70  
0
Max  
Min  
120  
100  
100  
50  
80  
0
Max  
Write Cycle Time  
tWC  
tCW  
tAW  
tDW  
tWP  
tAS  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Chip Select to End of Write  
Address Valid to End of Write  
Data Valid to End of Write  
Write Pulse Width  
Address Setup Time  
Address Hold Time  
tAH  
5
5
5
5
Output Active from End of Write  
Write Enable to Output in High Z  
Data Hold Time  
tOW1  
tWHZ1  
tDH  
5
5
5
5
25  
30  
35  
35  
0
0
0
0
1. This parameter is guaranteed by design but not tested.  
AC TEST CIRCUIT  
AC TEST CONDITIONS  
IOL  
Parameter  
Typ  
Unit  
V
Current Source  
Input Pulse Levels  
VIL = 0, VIH = 3.0  
Input Rise and Fall  
5
ns  
V
Input and Output Reference Level  
Output Timing Reference Level  
1.5  
1.5  
D.U.T.  
VZ  
1.5V  
V
(Bipolar Supply)  
Ceff = 50 pf  
NOTES:  
VZ is programmable from -2V to +7V.  
IOL & IOH programmable from 0 to 16mA.  
Tester Impedance Z0 = 75 .  
VZ is typically the midpoint of VOH and VOL.  
IOL & IOH are adjusted to simulate a typical resistive load circuit.  
ATE tester includes jig capacitance.  
IOH  
Current Source  
3
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com  

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