Datasheet > 5962-9084202MPA

5962-9084202MPA

更新时间： 2024-02-18 19:03:50

品牌	Logo	应用领域
MICROSS		/
页数	文件大小	规格书
12页	118K
描述
Operational Amplifier, 1 Func, 180uV Offset-Max, BIPolar, CDIP8, CERAMIC, DIP-8

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5962-9084202MPA 技术参数

生命周期：	Active	零件包装代码：	DIP
包装说明：	DIP,	针数：	8
Reach Compliance Code：	unknown	ECCN代码：	EAR99
HTS代码：	8542.33.00.01	风险等级：	5.08
放大器类型：	OPERATIONAL AMPLIFIER	最大平均偏置电流 (IIB)：	0.0008 µA
标称共模抑制比：	114 dB	最大输入失调电压：	180 µV
JESD-30 代码：	R-GDIP-T8	JESD-609代码：	e0
负供电电压上限：	-20 V	标称负供电电压 (Vsup)：	-15 V
功能数量：	1	端子数量：	8
最高工作温度：	125 °C	最低工作温度：	-55 °C
封装主体材料：	CERAMIC, GLASS-SEALED	封装代码：	DIP
封装形状：	RECTANGULAR	封装形式：	IN-LINE
认证状态：	Qualified	筛选级别：	MIL-STD-883
子类别：	Operational Amplifier	供电电压上限：	20 V
标称供电电压 (Vsup)：	15 V	表面贴装：	NO
温度等级：	MILITARY	端子面层：	TIN LEAD
端子形式：	THROUGH-HOLE	端子位置：	DUAL
Base Number Matches：	1

5962-9084202MPA 数据手册

4.2.2 Additional criteria for device classes Q and V.

a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the

device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under

document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

method 1015 of MIL-STD-883.

b. Interim and final electrical test parameters shall be as specified in table II herein.

c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in

MIL-PRF-38535, appendix B.

4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in

accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups

A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).

4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with

MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for

device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed

for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections

(see 4.4.1 through 4.4.4).

4.4.1 Group A inspection.

a. Tests shall be as specified in table II herein.

b. Subgroups 8, 9, 10, and 11 in table I, method 5005 MIL-STD-883 shall be omitted.

4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.

4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:

a. Test condition C. The test circuit shall be maintained by the manufacturer under document revision level control and

shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,

outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-

STD-883.

b. T = +125°C, minimum.

c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,

or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The

test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-

STD-883.

4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.

SIZE

STANDARD

MICROCIRCUIT DRAWING

5962-90842

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

1...6 7 8910 11 12

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