TABLE I. Electrical performance characteristics – Continued.
Conditions 1/
-55 C
T
+125 C
Group A
subgroups
Device
type
Limits 2/
Unit
A
Test
Symbol
unless otherwise specified
Min
Max
Time domain response section
Slew rate
SR
4
01
02
All
500
450
V/ s
A = +1, 3/
V
5,6
V
OUT
= 4 V
,
PP
measured at 1 V
PP
4,6
5
500
450
A = +1, 3/
V
V
OUT
= 4 V
,
PP
measured at 2 V
0.5 V step 3/
PP
Rise and fall time
TRS
TRL
9,11
10
1.0
1.4
7.5
8.5
10
ns
5 V step 3/
9
10,11
9,10,11
Settling time
Overshoot
TSP
OS
All
All
ns
%
2 V step at 0.2 % of 3/
the fixed value
0.5 V step 3/
9
10
15
10,11
1/ Unless otherwise specified, V = 5 V dc, load resistance (R ) = 100 , and source resistance (R ) = 50
.
S
L
S
2/ The algebraic convention, whereby the most negative value is a minimum and the most positive a maximum,
is used in this table.
3/ If not tested, shall be guaranteed to the limits specified in table I herein.
4/ Group A sample tested only.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are described in table I.
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN
listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For
packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the
option of not marking the "5962-" on the device.
SIZE
STANDARD
5962-89975
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
SHEET
C
8
DSCC FORM 2234
APR 97