TABLE 1. ELECTRICAL TESTS:
CONDITIONS
-55 °C <=TA<= +125°C 1/
Unless otherwise specified
Group A
Subgroup type
Device
Limits Limits Units
Min Max
TEST
ACCURACY
Symbol
All
Resolution
RES
RA
1,2,3
1,2,3
12.0
Bits
1,2,4,5
3,6
Relative Accuracy
VDD=+10.8V and VDD=+16.5V
LSB
±0.5
V
DD=10.8V (MX7547 only)
±1.0
±1.0
±2.0
±3.0
±6.0
All
Differential Nonlinearity
Gain Error
DNL
AE
Guaranteed monotonic
Measured using RFBA, RFBB; DAC
registers loaded with all 1’s,
1,2,3
1,2,3
LSB
LSB
1,4
2,5
3,6
V
DD=10.8V
All
Gain Tempco
∆Gain/∆Temperature
NOTE 2
Output Leakage Current
IOUTA, IOUTB
TCFS
ILKG
4
±5.0 ppm/°C
All
All
VDD=+16.5V, DAC registers
loaded with all 0s
1,3
2
nA
±10
±250
20
VREFA, VREFB Input
Leakage
VREFA, VREFB Input
Resistance Match
RREF
∆RREF
VIH
VDD=+10.8V
1,2,3
1,2,3
1,2,3
1,2,3
9
kΩ
%
V
V
DD=+10.8V
1,4
2,3,5,6
All
±1.0
±3.0
Digital Input High
Voltage
Digital Input Low
Voltage
Digital Input Leakage
Current
VDD=+10.8V and VDD=+16.5V
VDD=+10.8V and VDD=+16.5V
VIN=+0V or 16.5V
2.4
All
All
VIL
0.8
V
IIN
1,3
2
±1.0 µA
±10
All
All
Digital Input Capacitance CIN
4
1,2,3
1,2,3
10 pF
Supply Voltage
Supply Current
Current Settling Time
VDD
IDD
tSL
Operating range, VDD=16.5V
10.8
16.5
V
All
2.0 mA
4,5,6
9,10,11
4
1.5
1.5
To 0.5 LSB, IOUT load =100Ω,
CEXT=13pF, DAC output
measured from falling edge of WR
To 0.5 LSB, IOUT load =100Ω,
CEXT=13pF, DAC output
measured from rising edge of WR
µs
µs
___
1,2,3
4,5,6
Current Settling Time
tSL
___
VREFA
to IOUTA
Feedthrough
Error
DAC
registers
loaded
VREFA=20Vp-p
10kHz sine wave,
VREFB=0V
FTE
with all 0s
4,5,6
(SMD)
-70
-70
-65 dB
(SMD)
VREFB
to IOUTB
NOTE 2
VREFB=20Vp-p
10kHz sine wave,
VREFA=0V
VREFA
DAC
registers
loaded
VREFA=20Vp-p
10kHz sine wave,
VREFB=0V
to IOUTA
Feedthrough
Error
FTE
1,2,3
with all 0s
4
-65 dB
(SMD)
VREFB
to IOUTB
NOTE 2
VREFB=20Vp-p
10kHz sine wave,
VREFA=0V
(SMD)
----------------------- Electrical Characteristics of MX7537/47/883B for /883B
and SMD 5962-87763 and SMD 5962-89657
19-0057
Page 3 of
Rev. C
7