Datasheet > 5962-87787022X

5962-87787022X

更新时间： 2024-02-04 17:39:36

品牌	Logo	应用领域
ELANTEC		放大器
页数	文件大小	规格书
12页	55K
描述
Operational Amplifier,

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5962-87787022X 技术参数

生命周期：	Obsolete	Reach Compliance Code：	unknown
风险等级：	5.83	Is Samacsys：	N
放大器类型：	OPERATIONAL AMPLIFIER	认证状态：	Not Qualified
子类别：	Operational Amplifier	Base Number Matches：	1

5962-87787022X 数据手册

4. QUALITY ASSURANCE PROVISIONS

4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,

appendix A.

4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices

prior to quality conformance inspection. The following additional criteria shall apply:

a. Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

test method 1015 of MIL-STD-883.

(2) T = +125°C, minimum.

b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter

tests prior to burn-in are optional at the discretion of the manufacturer.

4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-

883 including groups A, B, C, and D inspections. The following additional criteria shall apply.

4.3.1 Group A inspection.

a. Tests shall be as specified in table II herein.

b. Subgroups 10 and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.

4.3.2 Groups C and D inspections.

a. End-point electrical parameters shall be as specified in table II herein.

b. Steady-state life test conditions, method 1005 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

level control and shall be made available to the preparing or acquiring activity upon request. The test circuit

shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent

specified in test method 1005 of MIL-STD-883.

(2) T = +125°C, minimum.

(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

SIZE

STANDARD

MICROCIRCUIT DRAWING

5962-87787

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

1...7 8 91011 12

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与5962-87787022X相关器件

型号	品牌	获取价格	描述	数据表
5962-8778702CA	ELANTEC	获取价格	Operational Amplifier,
5962-8778702CX	ELANTEC	获取价格	Operational Amplifier,
5962-87788012A	ETC	获取价格	x4 PROM
5962-8778801FA	ETC	获取价格	x4 PROM
5962-87788022A	ETC	获取价格	x4 PROM
5962-8778802EA	ETC	获取价格	x4 PROM
5962-8778802FA	ETC	获取价格	x4 PROM
5962-87789012A	ADI	获取价格	Voltage-output 8-bit digital-to-analog converter, including output amplifier, full micropr
5962-87789012X	ETC	获取价格	8-Bit Digital-to-Analog Converter
5962-8778901EA	ADI	获取价格	Voltage-output 8-bit digital-to-analog converter, including output amplifier, full micropr

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