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54F648DMQB PDF预览

54F648DMQB

更新时间: 2024-02-09 05:21:09
品牌 Logo 应用领域
德州仪器 - TI 输入元件输出元件逻辑集成电路
页数 文件大小 规格书
6页 28K
描述
F/FAST SERIES, 8-BIT REGISTERED TRANSCEIVER, INVERTED OUTPUT, CDIP24, 0.300 INCH, SLIM PACKAGE-24

54F648DMQB 技术参数

生命周期:Obsolete零件包装代码:DIP
包装说明:DIP,针数:24
Reach Compliance Code:unknown风险等级:5.65
其他特性:WITH DIRECTION CONTROL系列:F/FAST
JESD-30 代码:R-GDIP-T24长度:32.77 mm
逻辑集成电路类型:REGISTERED BUS TRANSCEIVER位数:8
功能数量:1端口数量:2
端子数量:24最高工作温度:125 °C
最低工作温度:-55 °C输出特性:3-STATE
输出极性:INVERTED封装主体材料:CERAMIC, GLASS-SEALED
封装代码:DIP封装形状:RECTANGULAR
封装形式:IN-LINE传播延迟(tpd):13 ns
认证状态:Not Qualified座面最大高度:5.72 mm
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:NO
技术:TTL温度等级:MILITARY
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL宽度:15.24 mm
Base Number Matches:1

54F648DMQB 数据手册

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MILITARY DATA SHEET  
Original Creation Date: 06/10/96  
Last Update Date: 07/30/96  
MN54F648-X REV 1A0  
Last Major Revision Date: 06/10/96  
OCTAL TRANSCEIVER/REGISTER WITH TRI-STATE OUTPUTS  
General Description  
This device consist of bus transceiver circuits with TRI-STATE, D-type flip-flops, and  
control circuitry arranged for multiplexed transmission of data directly from the input  
bus or from the internal registers. Data on the A or B bus will be clocked into the  
registers as the appropriate clock pin goes to a high logic level. Control G and  
direction pins are provided to control the transceiver function. In the transceiver mode,  
data present at the high impedance port may be stored in either the A or the B register or  
in both. The select controls can multiplex stored and real-time (transparent mode) data.  
The direction control determines which bus will receive data when the enable control G is  
Active LOW. In the isolation mode (control G HIGH), A data may be stored in the B register  
and/or B data may be stored in the A register.  
Industry Part Number  
NS Part Numbers  
54F648  
54F648DMQB  
54F648FMQB  
54F648LMQB  
Prime Die  
M648  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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