Datasheet > 54ACTQ657FMX

54ACTQ657FMX

更新时间： 2024-01-15 05:01:42

品牌	Logo	应用领域
德州仪器 - TI		输出元件逻辑集成电路
页数	文件大小	规格书
12页	216K
描述
ACT SERIES, 8-BIT TRANSCEIVER, TRUE OUTPUT, CDFP24, CERAMIC, FP-24

阅读下载

中文翻译

获取价格

技术参数
数据手册

如果您发现信息不准确，欢迎纠错

54ACTQ657FMX 技术参数

生命周期：	Obsolete	包装说明：	DFP,
Reach Compliance Code：	unknown	风险等级：	5.74
其他特性：	WITH DIRECTION CONTROL	系列：	ACT
JESD-30 代码：	R-GDFP-F24	长度：	15.4305 mm
逻辑集成电路类型：	BUS TRANSCEIVER	位数：	8
功能数量：	1	端口数量：	2
端子数量：	24	最高工作温度：	125 °C
最低工作温度：	-55 °C	输出特性：	3-STATE
输出极性：	TRUE	封装主体材料：	CERAMIC, GLASS-SEALED
封装代码：	DFP	封装形状：	RECTANGULAR
封装形式：	FLATPACK	传播延迟（tpd）：	9 ns
认证状态：	Not Qualified	座面最大高度：	2.286 mm
最大供电电压 (Vsup)：	5.5 V	最小供电电压 (Vsup)：	4.5 V
标称供电电压 (Vsup)：	5 V	表面贴装：	YES
技术：	CMOS	温度等级：	MILITARY
端子形式：	FLAT	端子节距：	1.27 mm
端子位置：	DUAL	Base Number Matches：	1

54ACTQ657FMX 数据手册

FACT Noise Characteristics

The setup of a noise characteristics measurement is critical

to the accuracy and repeatability of the tests. The following

is a brief description of the setup used to measure the noise

characteristics of FACT.

5. Set the word generator to toggle all but one output at a

frequency of 1 MHz. Greater frequencies will increase

DUT heating and affect the results of the measurement.

6. Set the word generator input levels at 0V LOW and 3V

HIGH for ACT devices and 0V LOW and 5V HIGH for AC

devices. Verify levels with a digital volt meter.

Equipment:

Hewlett Packard Model 8180A Word Generator

PC-163A Test Fixture

Tektronics Model 7854 Oscilloscope

V /V

OLP OLV

and V

/V :

OHP OHV

Determine the quiet output pin that demonstrates the

greatest noise levels. The worst case pin will usually be

the furthest from the ground pin. Monitor the output volt-

ages using a 50X coaxial cable plugged into a standard

SMB type connector on the test fixture. Do not use an

active FET probe.

Procedure:

1. Verify Test Fixture Loading: Standard Load 50 pF, 500X.

2. Deskew the word generator so that no two channels have

greater than 150 ps skew between them. This requires

that the oscilloscope be deskewed first. Swap out the

channels that have more than 150 ps of skew until all

channels being used are within 150 ps. It is important to

deskew the word generator channels before testing. This

will ensure that the outputs switch simultaneously.

Measure V

and V

OLV

on the quiet output during the

and V on the quiet out-

OLP

HL transition. Measure V

OHP

put during the LH transition.

OHV

Verify that the GND reference recorded on the oscillo-

scope has not drifted to ensure the accuracy and repeat-

ability of the measurements.

3. Terminate all inputs and outputs to ensure proper loading

of the outputs and that the input levels are at the correct

voltage.

and V

IHD

ILD

Monitor one of the switching outputs using a 50X coaxial

cable plugged into a standard SMB type connector on

the test fixture. Do not use an active FET probe.

First increase the input LOW voltage level, V , until the

output begins to oscillate. Oscillation is defined as noise

on the output LOW level that exceeds V limits, or on

output HIGH levels that exceed V limits. The input

LOW voltage level at which oscillation occurs is defined

as V

ILD

Next increase the input HIGH voltage level on the word

TL/F/10636–6

generator, V until the output begins to oscillate. Oscilla-

tion is defined as noise on the output LOW level that

FIGURE 1. Quiet Output Noise Voltage Waveforms

Note A. V

and V

are measured with respect to ground reference.

OLP

OHV

exceeds V limits, or on output HIGH levels that exceed

Note B. Input pulses have the following characteristics: f

150 ps.

1 MHz, t

limits. The input HIGH voltage level at which oscilla-

tion occurs is defined as V

3 ns, t

3 ns, skew

IHD

4. Set V

to 5.0V.

Verify that the GND reference recorded on the oscillo-

scope has not drifted to ensure the accuracy and repeat-

ability of the measurements.

TL/F/10636–7

FIGURE 2. Simultaneous Switching Test Circuit

1...6 7 8910 11 12

中文翻译

下载PDF

与54ACTQ657FMX相关器件

型号	品牌	获取价格	描述	数据表
54ACTQ657L	NSC	获取价格	Quiet Series Octal Bidirectional Transceiver with 8-Bit Parity Generator/Checker and TRI-S
54ACTQ657LMQB	ETC	获取价格	Single 8-bit Bus Transceiver
54ACTQ657LMQR	TI	获取价格	ACT SERIES, 8-BIT TRANSCEIVER, TRUE OUTPUT, CQCC28, CERAMIC, LCC-28
54ACTQ657LMX	TI	获取价格	ACT SERIES, 8-BIT TRANSCEIVER, TRUE OUTPUT, CQCC28, CERAMIC, LCC-28
54ACTQ657SD	NSC	获取价格	Quiet Series Octal Bidirectional Transceiver with 8-Bit Parity Generator/Checker and TRI-S
54ACTQ657SDMQB	ETC	获取价格	Single 8-bit Bus Transceiver
54ACTQ657SDMQR	TI	获取价格	ACT SERIES, 8-BIT TRANSCEIVER, TRUE OUTPUT, CDIP24, 0.300 INCH, SLIM, CERAMIC, DIP-24
54ACTQ821	NSC	获取价格	Quiet Series 10-Bit D Flip-Flop with TRI-STATE Outputs
54ACTQ821DM	TI	获取价格	ACT SERIES, 10-BIT DRIVER, TRUE OUTPUT, CDIP24, CERAMIC, DIP-24
54ACTQ821F	NSC	获取价格	Quiet Series 10-Bit D Flip-Flop with TRI-STATE Outputs

与54ACTQ657FMX相关文章

晶闸管阳极与阴极之间加电压时控制极的电流流动分析
2024-06-05

10
探究MOS管沟道夹断后载流子传输机制及其电路设计影响
2024-06-05

9
光敏电阻的工作原理、作用及检测方法
2024-06-05

8
ENC28J60以太网控制器全面解析：特性、应用、引脚说明
2024-06-05

6

产品中心

服务支持

精选活动

关于我们

帮助中心

54ACTQ657FMX

54ACTQ657FMX 技术参数

54ACTQ657FMX 数据手册

与54ACTQ657FMX相关器件

与54ACTQ657FMX相关文章

您还可以找

产品中心

服务支持

精选活动

关于我们

帮助中心

54ACTQ657FMX

54ACTQ657FMX 技术参数

54ACTQ657FMX 数据手册

与54ACTQ657FMX相关器件

与54ACTQ657FMX相关文章

您还可以找

您在本页遇到什么问题？