Datasheet > 27C17AF-25IL

27C17AF-25IL

更新时间： 2022-11-26 04:24:45

品牌	Logo	应用领域
美国微芯 - MICROCHIP		可编程只读存储器电动程控只读存储器电可擦编程只读存储器
页数	文件大小	规格书
8页	70K
描述
16K (2K x 8) CMOS EEPROM

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27C17AF-25IL 数据手册

28C17A

TABLE 1-3:

READ OPERATION AC CHARACTERISTICS

AC Testing Waveform:

Output Load:

Input Rise and Fall Times:

Ambient Temperature:

VIH = 2.4V; VIL = 0.45V; VOH = 2.0V; VOL = 0.8V

1 TTL Load + 100 pF

20 ns

Commercial (C):

Tamb

0˚C to +70˚C

-40˚C to +85˚C

Industrial

(I):

28C17A-15

Symbol

28C17A-20

28C17A-25

Parameter

Units

Conditions

Min

Max

Min

Max

Min

Max

Address to Output Delay

CE to Output Delay

OE to Output Delay

tACC

tCE

—

150

—

200

—

250

100

OE = CE = VIL

OE = VIL

tOE

CE = VIL

CE or OE High to Output

Float

tOFF

Output Hold from Address,

CE or OE, whichever occurs

ﬁrst.

tOH

—

Endurance

cycles 25°C, Vcc =

5.0V, Block

Mode (Note)

Note: This parameter is not tested but guaranteed by characterization. For endurance estimates in a speciﬁc appli-

cation, please consult the Total Endurance Model which can be obtained on our BBS or website.

FIGURE 1-1: READ WAVEFORMS

VIH

Address

Address Valid

VIL

VIH

VIL

tCE(2)

VIH

VIL

tOFF(1,3)

tOH

tOE(2)

VOH

VOL

High Z

Data

Valid Output

tACC

VIH

VOL

Notes: (1) tOFF is specified for OE or CE, whichever occurs first

(2) OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE

(3) This parameter is sampled and is not 100% tested

1996 Microchip Technology Inc.

DS11127G-page 3

1 234 5 6 7 8

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