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22V10

更新时间: 2024-10-31 22:10:59
品牌 Logo 应用领域
莱迪思 - LATTICE /
页数 文件大小 规格书
29页 387K
描述
High Performance E2CMOS PLD Generic Array Logic

22V10 数据手册

 浏览型号22V10的Datasheet PDF文件第2页浏览型号22V10的Datasheet PDF文件第3页浏览型号22V10的Datasheet PDF文件第4页浏览型号22V10的Datasheet PDF文件第5页浏览型号22V10的Datasheet PDF文件第6页浏览型号22V10的Datasheet PDF文件第7页 
GAL22V10  
High Performance E2CMOS PLD  
Generic Array Logic™  
Functional Block Diagram  
Features  
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY  
— 4 ns Maximum Propagation Delay  
— Fmax = 250 MHz  
RESET  
I/CLK  
8
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
I/O/Q  
I/O/Q  
— 3.5 ns Maximum from Clock Input to Data Output  
I
I
I
I
I
I
— UltraMOS® Advanced CMOS Technology  
10  
12  
• ACTIVE PULL-UPS ON ALL PINS  
• COMPATIBLE WITH STANDARD 22V10 DEVICES  
— Fully Function/Fuse-Map/Parametric Compatible  
with Bipolar and UVCMOS 22V10 Devices  
I/O/Q  
I/O/Q  
• 50% to 75% REDUCTION IN POWER VERSUS BIPOLAR  
— 90mA Typical Icc on Low Power Device  
— 45mA Typical Icc on Quarter Power Device  
14  
16  
16  
14  
• E2 CELL TECHNOLOGY  
— Reconfigurable Logic  
— Reprogrammable Cells  
— 100% Tested/100% Yields  
— High Speed Electrical Erasure (<100ms)  
— 20 Year Data Retention  
I/O/Q  
I/O/Q  
I
I
• TEN OUTPUT LOGIC MACROCELLS  
— Maximum Flexibility for Complex Logic Designs  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
12  
10  
• PRELOAD AND POWER-ON RESET OF REGISTERS  
— 100% Functional Testability  
• APPLICATIONS INCLUDE:  
— DMA Control  
— State Machine Control  
— High Speed Graphics Processing  
— Standard Logic Speed Upgrade  
I
I
8
I
• ELECTRONIC SIGNATURE FOR IDENTIFICATION  
ESCRIPTION  
PRESET  
Pin Configuration  
Description  
DIP  
The GAL22V10, at 4ns maximum propagation delay time, combines  
a high performance CMOS process with Electrically Erasable (E2)  
floating gate technology to provide the highest performance avail-  
able of any 22V10 device on the market. CMOS circuitry allows  
the GAL22V10 to consume much less power when compared to  
bipolar 22V10 devices. E2 technology offers high speed (<100ms)  
erase times, providing the ability to reprogram or reconfigure the  
device quickly and efficiently.  
PLCC  
1
6
Vcc  
24  
I/CLK  
I/O/Q  
I
I
I
I
I
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I
4
2
28  
26  
5
7
25  
23  
I
I
I
I/O/Q  
I/O/Q  
I/O/Q  
GAL  
22V10  
The generic architecture provides maximum design flexibility by  
allowing the Output Logic Macrocell (OLMC) to be configured by  
the user. The GAL22V10 is fully function/fuse map/parametric com-  
patible with standard bipolar and CMOS 22V10 devices.  
GAL22V10  
Top View  
NC  
NC  
18  
I
I
I
I
I
9
21  
19  
I/O/Q  
I/O/Q  
I/O/Q  
11  
I
12  
14  
16  
18  
Unique test circuitry and reprogrammable cells allow completeAC,  
DC, and functional testing during manufacture. As a result, Lat-  
tice Semiconductor delivers 100% field programmability and func-  
tionality of all GAL products. In addition, 100 erase/write cycles and  
data retention in excess of 20 years are specified.  
I
I
GND  
12  
13  
Copyright © 2000 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject  
to change without notice.  
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.  
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com  
August 2000  
22v10_06  
1

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