Multilayer Ceramic Capacitors
Approval Sheet
No.
Item
Test Condition
Requirements
11. Resistance to * Solder temperature: 260±5°C
Soldering Heat * Dipping time: 10±1 sec
* No remarkable damage.
* Cap change:
* Preheating: 120 to 150°C for 1 minute before imme rse the
NP0: within ±2.5% or ±0.25pF whichever is larger.
X7R: within ±7.5%
capacitor in a eutectic solder.
* Before initial measurement (Class II only): To apply de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
X5R: within ±15.0%
Q/D.F., I.R. and dielectric strength: To meet initial requirements.
* 25% max. leaching on each edge.
12. Temperature
Cycle
* Conduct the five cycles according to the temperatures and * No remarkable damage.
time.
Step Temp. (°C)
* Cap change:
NP0: within ±2.5% or ±0.25pF whichever is larger.
X7R: within ±7.5%
Time (min.)
30±3
1
2
3
4
Min. operating temp. +0/-3
Room temp.
X5R: within ±15.0%
2~3
* Q/D.F., I.R. and dielectric strength: To meet initial requirements.
Max. operating temp. +3/-0
Room temp.
30±3
2~3
* Before initial measurement (Class II only): To apply de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
13. Humidity
* Test temp.: 40±2°C
* No remarkable damage.
(Steady State) * Humidity: 90~95% RH
* Test time: 500+24/-0hrs.
* Cap change:
NP0: within ±5.0% or ±0.5pF whichever is larger.
* Before initial measurement (Class II only): To apply de-aging X7R: within ±12.5%
at 150°C for 1hr then set for 24±2 hrs at room temp . X5R: within ±25.0%
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging * Q/D.F. value:
at 150°C for 1hr then set for 24±2 hrs at room temp . NP0: Cap≥30pF, Q≥350; 10pF≤Cap<30pF, Q≥275+2.5C
Cap<10pF; Q≥200+10C
X7R: ≤7.5%
X5R: ≤20%
* I.R.:
NP0, X7R: ≥1GΩ or RxC≥50Ω-F whichever is smaller.
X5R: RxC≥10Ω-F.
14. Humidity Load * Test temp.: 40±2°C
* No remarkable damage.
(Damp Heat)
* Humidity: 90~95%RH
* Cap change:
* Test time: 500+24/-0 hrs.
* To apply voltage：rated voltage.
NP0: within ±7.5% or ±0.75pF whichever is larger.
X7R: within ±15.0%
* Before initial measurement (Class II only): To apply de-aging X5R: within ±25.0%
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Q/D.F. value:
NP0: Cap≥30pF, Q≥200; Cap<30pF; Q≥100+10/3C
X7R:
X5R:
≤
7.5%
≤20%
* I.R.:
NP0, X7R: ≥500MΩ or RxC≥25Ω-F whichever is smaller.
X5R: RxC≥5Ω-F.
15. High
* Test temp.:
Temperature
NP0, X7R: 125±3°C
X5R: 85±3°C
Load
(Endurance)
* To apply voltage:
(1) NP0, X7R : 200% of rated voltage
* No remarkable damage.
* Cap change:
(2) X5R: 10V : 150 % of rated voltage
6.3V : 100 % of rated voltage
* Test time: 1000+24/-0 hrs.
NP0: within ±3.0% or ±0.3pF whichever is larger.
X7R: within ±12.5%
* Before initial measurement (Class II only): To apply de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging at
150°C for 1hr then set for 24±2 hrs at room temp.
X5R: within ±25.0%
* Q/D.F. value:
NP0: Cap≥30pF, Q≥350; 10pF≤Cap<30pF, Q≥275+2.5C
Cap<10pF; Q≥200+10C
** De-rating conditions:
X7R:
X5R:
≤
7.5%
≤20%
* I.R.:
NP0, X7R: ≥1GΩ or RxC≥50Ω-F whichever is smaller.
X5R: RxC≥10Ω-F.
* "Room condition" Temperature: 15 to 35°C, Relativ e humidity: 25 to 75%, Atmospheric pressure: 86 to 106kPa.
Page 6 of 8
ASC_Ultra Small_(01R5)
Feb. 2023
5秒后页面跳转
MAX7219驱动8段数码管详解及数据手册关键信息
ATMEGA328P技术资料深入分析
AT24C02芯片手册管脚信息、参数分析、应用领域详解
AT24C256芯片手册参数分析、引脚说明、读写程序示例
微信公众号
抖音公众号
浙公网安备 33010502006866号 浙ICP备10014259号-119
营业执照ICP证
数据手册
如果您发现信息不准确，
