Datasheet > WW12NR006JTLJ

WW12NR006JTLJ

更新时间： 2024-04-09 18:57:15

品牌	Logo	应用领域
华新科技 - WALSIN		/
页数	文件大小	规格书
8页	797K
描述
Metal Plate Low Ohm Current Sense Chip-Resistor (Automotive) 1206(3216), 0.006Ω, ±5%, 1W

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WW12NR006JTLJ 数据手册

Approval sheet

TEST AND REQUIREMENTS

Essentially all tests are carried out according to the schedule of IEC publication 115-8, category

LCT/UCT/56(rated temperature range : Lower Category Temperature, Upper Category Temperature; damp

heat, long term, 56 days). The testing also meets the requirements specified by EIA, EIAJ and JIS.

The tests are carried out in accordance with IEC publication 68, "Recommended basic climatic and mechanical

robustness testing procedure for electronic components" and under standard atmospheric conditions according

to IEC 60068-1, subclause 5.3. Unless otherwise specified, the following value supplied :

Temperature: 15°C to 35°C.

Relative humidity: 45% to 75%.

Air pressure: 86kPa to 106 kPa (860 mbar to 1060 mbar).

All soldering tests are performed with midly activated flux.

TEST

PROCEDURE

REQUIREMENT

R/R max.

±(1%+0.5mΩ)

△

Test 1000 hrs./ @T=170℃/ Un-powered.

High temperature exposure

MIL-STD-202 Method 108

Measurement at 24±2 hours after test conclusion.

no visible damage

R/R max.

±(1%+0.5mΩ)

△

Temperature Cycling

Test 1000 cycles (-55℃ to +125℃).

JESD22 Method JA-104

Measurement at 24±2 hours after test conclusion

no visible damage

R/R max.

±(1%+0.5mΩ)

△

Moisture Resistance

Test 65℃/ 80~100%RH/ 10Cycles(t=24hrs/cycle).

MIL-STD-202 Method 106 Measurement at 24±2 hours after test conclusion.

no visible damage

R/R max.

±(1%+0.5mΩ)

△

Biased Humidity

Test 1000 hours/ @85℃/85% RH./ 10% of operation power.

MIL-STD-202 Method 103 Measurement at 24±2 hours after test conclusion.

no visible damage

R/R max.

±(1%+0.5mΩ)

△

Operational Life

Test 1000 hrs./ TA=125℃ / 35% of operating power.

MIL-STD-202 Method 108 Measurement at 24±2 hours after test conclusion

no visible damage

No visual damage and

refer WTC marking

code.

External Visual

Electrical test not required. Inspect device construction, marking and

workmanship

MIL-STD-883 Method 2009

Physical Dimensions

The chip dimension (L, W, T, A) prescribed in the detail specification Within the specified

shall be checked

tolerance

JESD22 Method JB-100

Within product

specification tolerance

and no visible damage

Mechanical Shock

Test Peak value:100g's / Wave:Hail-sine / Duration:6ms /

Velocity:12.3ft/sec.

MIL-STD-202 Method 213

R/R max.

±(1%+0.5mΩ)

△

Vibration

Test 5g’s for 20min., 12 cycles each of 3 orientations.

MIL-STD-202 Method 204

no visible damage

Page 6 of 8

ASC_WW12M_J-WW12N_J_AUTO_V07

Dec - 2023

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