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WLFM201209M3R3PC PDF预览

WLFM201209M3R3PC

更新时间: 2024-04-09 18:57:56
品牌 Logo 应用领域
华新科技 - WALSIN /
页数 文件大小 规格书
7页 1142K
描述
Multi-Layer Power Inductor / WLFM Series 3.3, 800mA

WLFM201209M3R3PC 数据手册

 浏览型号WLFM201209M3R3PC的Datasheet PDF文件第1页浏览型号WLFM201209M3R3PC的Datasheet PDF文件第2页浏览型号WLFM201209M3R3PC的Datasheet PDF文件第3页浏览型号WLFM201209M3R3PC的Datasheet PDF文件第4页浏览型号WLFM201209M3R3PC的Datasheet PDF文件第6页浏览型号WLFM201209M3R3PC的Datasheet PDF文件第7页 
Approval Sheet  
Reliability and Test Conditions  
Test item  
Test condition  
Criteria  
1.More than 95 % of terminal  
electrode should be covered with  
new solder  
Solder temperature : 260 ± 5℃  
Flux : Rosin  
2.No mechanical damage  
Resistance to Solder Heat  
3.Inductance value should be within  
± 20 % of the initial value  
DIP time : 10 ± 1 sec  
* Apply DC 0.4 ~ 0.6A to chip for 1 ~  
3 sec. before to measure  
inductance.  
1. More than 95 % of terminal  
Solder temperature : 235 ± 5℃  
Flux : Rosin  
electrode should be covered with  
new solder  
Solderability  
3. DIP time : 5 ± 1 sec  
2. No mechanical damage  
Reflow temperature : 245It shall be  
Soldered on the substrate applying direction  
parallel to the substrate  
1. No mechanical damage  
Adhesive Test  
2. Soldering the products on PCB  
after the pulling test force > 5 N  
Apply force(F) : 5 N  
Test time : 10 sec  
1.No mechanical damage  
Temperature:-40 ~ 85For 30 minutes  
2.Inductance should be within ±20%  
of the initial value  
each  
Temperature Cycle  
Cycle: 100 cycles  
* Apply DC 0.4 ~ 0.6A to chip for 1 ~  
3 sec. before to measure  
inductance.  
Measurement:At ambient temperature 24  
hours after test completion  
1. No mechanical damage  
Temperature: 85 ± 5℃  
2. Inductance should be within ±20%  
of the initial value  
High Temperature  
Resistance  
Testing time: 1000 hrs  
* Apply DC 0.4 ~ 0.6A to chip for 1 ~  
3 sec. before to measure  
inductance.  
Measurement: at ambient temperature 24  
hours after test completion  
1.No mechanical damage  
Temperature: 40± 2℃  
Humidity: 90-95 % RH  
Testing time: 1000 hrs  
2.Inductance should be within ±20%  
of the initial value  
Humidity  
* Apply DC 0.4 ~ 0.6A to chip for 1 ~  
3 sec. before to measure  
inductance.  
Measurement:At ambient temperature 24  
hours after test completion  
At ambient temperature & humidity  
WLFM product surface temp  
Rated Current  
Testing time:5 minutes ( under full rated  
current )  
below room temperature plus 40℃  
Page 5 of 7  
ASC_WLFM_C Series  
Jul.2020  

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