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WA02F3902FTL PDF预览

WA02F3902FTL

更新时间: 2024-04-09 18:56:20
品牌 Logo 应用领域
华新科技 - WALSIN /
页数 文件大小 规格书
7页 584K
描述
0201*4, 39000Ω, ±1%, 1/32W

WA02F3902FTL 数据手册

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Approval sheet  
TEST AND REQUIREMENTS  
Essentially all tests are carried out according to the schedule of IEC publication 115-8, category  
LCT/UCT/56(rated temperature range : Lower Category Temperature, Upper Category Temperature; damp  
heat, long term, 56 days). The testing also meets the requirements specified by EIA, EIAJ and JIS.  
The tests are carried out in accordance with IEC publication 68, "Recommended basic climatic and mechanical  
robustness testing procedure for electronic components" and under standard atmospheric conditions according  
to IEC 60068-1, subclause 5.3. Unless otherwise specified, the following value supplied :  
Temperature: 15°C to 35°C.  
Relative humidity: 45% to 75%.  
Air pressure: 86kPa to 106 kPa (860 mbar to 1060 mbar).  
All soldering tests are performed with midly activated flux.  
REQUIREMENT  
TEST  
PROCEDURE  
Resistor  
Within the specified  
tolerance Refer to  
“QUICK REFERENCE  
DATA”  
Jumper  
Electrical  
- DC resistance values measurement  
Characteristics  
- Temperature Coefficient of Resistance (T.C.R)  
Natural resistance change per change in degree  
centigrade.  
JISC5201-1: 1998  
N/a  
R2 R  
R
1t2 t1  
Clause 4.8  
106 (ppm/C) t1 : 20°C+5°C-1°C  
1
R1 : Resistance at reference temperature  
R2 : Resistance at test temperature  
Short time overload  
(S.T.O.L)  
Permanent resistance change after a 5 seconds  
application of a voltage 2.5 times RCWV or the  
maximum overload voltage specified in the above  
list, whichever is less.  
R/R max.  
±(2%+0.10)  
< 50m  
< 50m  
Clause 4.13  
Resistance to soldering Un-mounted chips completely immersed for  
heat(R.S.H)  
Δ R/R max. ±(1%+0.05Ω )  
no visible damage  
10±1second in a SAC solder bath at 260±5ºC  
Clause 4.18  
Un-mounted chips completely immersed for  
2±0.5 second in a SAC solder bath at 235±5℃  
good tinning (>95% covered)  
no visible damage  
Solderability  
Clause 4.17  
Temperature cycling  
30 minutes at -55C3C, 2~3 minutes at  
20°C+5°C-1°C, 30 minutes at +125C3C, 2~3  
minutes at 20°C+5°C-1°C, total 5 continuous  
cycles  
Δ R/R max. ±(1%+0.05Ω )  
no visible damage  
Clause 4.19  
< 50m  
< 100m  
< 50m  
Load life (endurance)  
Clause 4.25  
1000 +48/-0 hours, loaded with RCWV or Vmax  
in chamber controller 70±2ºC, 1.5 hours on and  
0.5 hours off  
1000 +48/-0 hours, loaded with RCWV or Vmax  
in humidity chamber controller at 40C2C and  
90~95% relative humidity, 1.5hours on and 0.5  
hours off  
Δ R/R max. ±(3%+0.1Ω )  
no visible damage  
Load life in Humidity  
Clause 4.24  
Δ R/R max. ±(3%+0.1Ω )  
no visible damage  
Adhesion  
Clause 4.32  
No remarkable damage or removal of  
the terminations.  
Pressurizing force: 5N, Test time: 10±1sec.  
Insulation Resistance  
Clause 4.6  
Apply the maximum overload voltage (DC) for  
1minute  
R1GΩ  
Dielectric Withstand  
Voltage  
Apply the maximum overload voltage (AC) for 1  
minute  
No breakdown or flashover  
Clause 4.7  
Page 6 of 7  
ASC_WA02F_V05  
JAN - 2022  

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