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TSL245R-LF PDF预览

TSL245R-LF

更新时间: 2024-02-08 12:41:23
品牌 Logo 应用领域
TAOS 转换器
页数 文件大小 规格书
10页 157K
描述
INFRARED LIGHT-TO-FREQUENCY CONVERTER

TSL245R-LF 技术参数

是否Rohs认证: 符合生命周期:Contact Manufacturer
Reach Compliance Code:unknown风险等级:5.59
安装特点:SURFACE MOUNT端子数量:3
最高工作温度:70 °C最低工作温度:-25 °C
子类别:Photo ICs最大压摆率:0.003 mA
表面贴装:YESBase Number Matches:1

TSL245R-LF 数据手册

 浏览型号TSL245R-LF的Datasheet PDF文件第1页浏览型号TSL245R-LF的Datasheet PDF文件第2页浏览型号TSL245R-LF的Datasheet PDF文件第3页浏览型号TSL245R-LF的Datasheet PDF文件第5页浏览型号TSL245R-LF的Datasheet PDF文件第6页浏览型号TSL245R-LF的Datasheet PDF文件第7页 
TSL245R  
INFRARED LIGHT-TO-FREQUENCY CONVERTER  
TAOS060D SEPTEMBER 2007  
APPLICATION INFORMATION  
Power-supply considerations  
Power-supply lines must be decoupled by a 0.01-μF to 0.1-μF capacitor with short leads placed close to the  
TSL245R (Figure 5). A low-noise power supply is required to minimize jitter on output pulse.  
V
DD  
MCU  
2
0.1 μF  
3
TSL245R  
Timer/Port  
1
Figure 5. Typical TSL245R Interface to a Microcontroller  
Device Operational Details  
The frequency at the output pin (OUT) is given by:  
fO = fD + (Re) (Ee)  
where:  
fO  
is the output frequency  
fD  
Re  
Ee  
is the output frequency for dark condition (Ee = 0)  
is the device responsivity for a given wavelength of light given in kHz/(μW/cm2)  
is the incident irradiance in μW/cm2  
f is an output frequency resulting from leakage currents. As shown in the equation above, this frequency  
D
represents a light-independent term in the total output frequency f . At very low light levels, this dark frequency  
O
can be a significant portion of f . The dark frequency is temperature dependent. For optimum performance of  
O
any given device over the full output range, the value of f should be measured (in the absence of light) and  
D
later subtracted from subsequent light measurement (see Figure 1).  
Output interface  
The output of the device is designed to drive a standard TTL or CMOS logic input over short distances. If lines  
greater than 12 inches are used on the output, a buffer or line driver is recommended.  
Measuring the frequency  
The choice of interface and measurement technique depends on the desired resolution and data-acquisition  
rate. For maximum data-acquisition rate, period-measurement techniques are used.  
Period measurement requires the use of a fast reference clock with available resolution directly related to  
reference-clock rate. The technique is employed to measure rapidly varying light levels or to make a fast  
measurement of a constant light source.  
Maximum resolution and accuracy may be obtained using frequency-measurement, pulse-accumulation,  
or integration techniques. Frequency measurements provide the added benefit of averaging out random- or  
high-frequency variations (jitter) resulting from noise in the light signal. Resolution is limited mainly by available  
counter registers and allowable measurement time. Frequency measurement is well suited for slowly varying  
or constant light levels and for reading average light levels over short periods of time. Integration, the  
accumulation of pulses over a very long period of time, can be used to measure exposure — the amount of light  
present in an area over a given time period.  
Copyright E 2007, TAOS Inc.  
The LUMENOLOGY r Company  
r
r
4
www.taosinc.com  

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