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TLE493D-P2B6 A1 PDF预览

TLE493D-P2B6 A1

更新时间: 2023-09-03 20:29:53
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英飞凌 - INFINEON /
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描述
The Infineon TLE493D-P2B6 is our newest magnetic 3D Hall sensor enabled by new and improved accuracy. It is the best product for high performance applications with respect to pricing and package size.

TLE493D-P2B6 A1 数据手册

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TLE493D-P2B6  
High Accuracy Low Power 3D Hall Sensor with I2C Interface  
Specification  
2
Specification  
This sensor is intended to be used in an automotive environment. This chapter describes the environmental  
conditions required by the device (magnetic, thermal and electrical).  
2.1  
Absolute maximum ratings  
Stresses above those listed under “Absolute maximum ratings” may cause permanent damage to the device.  
This is a stress rating only and functional operation of the device at these or any other conditions above those  
indicated in the operational sections of this specification is not implied. Furthermore, only single error cases are  
assumed. More than one stress/error case may also damage the device.  
Exposure to absolute maximum rating conditions for extended periods may affect device reliability. During  
absolute maximum rating overload conditions the voltage on VDD pin with respect to ground (GND) must not  
exceed the values defined by the absolute maximum ratings.  
Table 2  
Absolute maximum ratings  
Symbol  
Parameter  
Values  
Unit  
Note or test condition  
Min.  
-40  
-0.3  
Typ.  
Max.  
125  
3.5  
Junction temperature  
Voltage on VDD  
Tj  
°C  
V
VDD  
Bmax  
Vmax  
Magnetic field  
±1  
T
Voltage range on any pin to GND  
-0.1  
3.5  
V
open-drain outputs are  
not current limited.  
Table 3  
ESD protection2)  
Ambient temperature TA = 25°C  
Parameter  
Symbol  
Values  
Unit  
Note or test condition  
Min.  
Typ.  
Max.  
ESD voltage (HBM)3)  
ESD voltage (CDM)4)  
VESD  
±2.0  
±0.75  
±0.5  
kV  
kV  
kV  
R = 1.5 kΩ, C = 100 pF  
for corner pins  
all pins  
2
Characterization of ESD is carried out on a sample basis, not subject to production test.  
Human body model (HBM) tests according to ANSI/ESDA/JEDEC JS-001.  
Charged device model (CDM), ESD susceptibility according to JEDEC JESD22-C101.  
3
4
Datasheet  
8
1.0  
2021-01-12  

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