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SM2405T-6 PDF预览

SM2405T-6

更新时间: 2024-01-28 18:58:10
品牌 Logo 应用领域
铁电 - RAMTRON 时钟动态存储器内存集成电路
页数 文件大小 规格书
99页 2618K
描述
Cache DRAM, 512KX32, 4.2ns, CMOS, PQFP100, 20 X 14 MM, 0.65 MM PITCH, LQFP-100

SM2405T-6 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:QFP
包装说明:LQFP, QFP100,.63X.87针数:100
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.32.00.02风险等级:5.92
访问模式:DUAL BANK PAGE BURST最长访问时间:4.2 ns
其他特性:AUTO/SELF REFRESH最大时钟频率 (fCLK):166 MHz
I/O 类型:COMMON交错的突发长度:1,2,4,8
JESD-30 代码:R-PQFP-G100JESD-609代码:e0
长度:20 mm内存密度:16777216 bit
内存集成电路类型:CACHE DRAM内存宽度:32
功能数量:1端口数量:1
端子数量:100字数:524288 words
字数代码:512000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:512KX32输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LQFP
封装等效代码:QFP100,.63X.87封装形状:RECTANGULAR
封装形式:FLATPACK峰值回流温度(摄氏度):NOT SPECIFIED
电源:2.5/3.3,3.3 V认证状态:Not Qualified
刷新周期:2048座面最大高度:1.6 mm
自我刷新:YES连续突发长度:1,2,4,8,FP
最大待机电流:0.002 A子类别:Other Memory ICs
最大压摆率:0.34 mA最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):3 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:GULL WING端子节距:0.65 mm
端子位置:QUAD处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:14 mmBase Number Matches:1

SM2405T-6 数据手册

 浏览型号SM2405T-6的Datasheet PDF文件第2页浏览型号SM2405T-6的Datasheet PDF文件第3页浏览型号SM2405T-6的Datasheet PDF文件第4页浏览型号SM2405T-6的Datasheet PDF文件第5页浏览型号SM2405T-6的Datasheet PDF文件第6页浏览型号SM2405T-6的Datasheet PDF文件第7页 
0316409C 4M  
x
412/10, 3.3V, SR. 0316169C 1M x 1612/8, 3.3V, SR. 0316809C 2M x 812/9, 3.3V, SR.  
512Kx32  
Preliminary Data Sheet  
16Mbit Enhanced Synchronous DRAM  
Overview  
Features  
• High Performance:  
CAS latency = 2  
• Programmable Burst Length: 1,2,4,8,full-page  
-6  
166  
6
-7.5  
133  
7.5  
-10  
100  
10  
Units  
MHz  
ns  
• Programmable Wrap Sequence, Sequential or  
Interleaved  
fCK  
tCK2  
tAC2  
Clock Frequency  
Clock Cycle  
• Automatic and Controlled Precharge Command  
• Hidden Precharge and Hidden Auto Refresh  
• Self Refresh  
Clock Access Time  
4.2  
4.5  
5
ns  
• 8Kbit SRAM Row Cache per Bank  
• Supports Row Pipelining for Random Row  
• Suspend Mode and Power Down Mode  
• 2048 refresh cycles / 32ms  
Reads of 4:1:1:1:2:1:1:1:2:1:1:1 @ 133MHz  
• Pin Compatible with JEDEC Standard SGRAMs  
• Single 3.3V ± 0.3V Power Supply  
• JEDEC Superset Standard ESDRAM  
• Programmable Caching Policy  
• LVTTL and 2.5V I/O Interface with Flexible VDDQ  
• Package: 100 pin LQFP (0.65 mm pin pitch)  
• Programmable CAS Latency: 1, 2, 3  
• Dual Banks controlled by A10 (Bank Select)  
Description  
the user to perform operations on the DRAM array  
concurrent with cache reads. These operations  
include new row activation, precharge, and refresh-  
ing the DRAM array. Since new row activations can  
occur during cache read cycles, it is possible for the  
ESDRAM to pipeline random row reads, thus reduc-  
ing the page miss latency to that of a page hit.  
As a JEDEC superset standard, the Enhanced Syn-  
chronous DRAM is an evolutionary modification to a  
JEDEC standard Synchronous DRAM. The  
ESDRAM incorporates changes to a standard  
SDRAM which reduce the latency, increase the  
bandwidth, and allow for concurrent operations to  
the same bank. Even with these improvements in  
performance and functionality, the Enhanced  
SDRAM remains pin compatible with a JEDEC stan-  
dard 512Kx32 SGRAM. As a result, this ESDRAM is  
plug-compatible with an SGRAM and operates like a  
standard SDRAM when used in an SDRAM applica-  
tion.  
This device is designed to comply with all JEDEC  
standards set for SDRAM products, both electrically  
and mechanically. All the control, address, and data  
input/output circuits are synchronized with the posi-  
tive edge of an externally supplied clock.  
Prior to any access operation, the CAS latency,  
burst length, burst sequence, and write caching pol-  
icy must be programmed into the device by address  
inputs A0-A10 during a Mode Register Set com-  
mand cycle. The write policy is set as either Write  
Transfer mode or No Write Transfer mode.  
The 512Kx32 Enhanced Synchronous DRAM com-  
bines a fast DRAM array with a 16Kbit SRAM cache.  
The DRAM array is separated into two fully indepen-  
dent 8Mbit DRAM banks with 8Kbits of SRAM cache  
per bank. The SRAM cache is integrated into the  
DRAM array as tightly coupled row registers. The  
integrated cache provides several advantages. The  
first advantage is high speed random column  
accesses (<10ns). Another advantage is that  
through the use of auto-precharge, the cache allows  
This device supports Self Refresh mode, and oper-  
ates with a single 3.3V ± 0.3V power supply. The  
device is available in a 100 pin LQFP package.  
©1999 Enhanced Memory Systems. All rights reserved.  
Enhanced Memory Systems Inc., 1850 Ramtron Dr., Colo Spgs, CO 80921  
PHONE: (800) 545-DRAM; FAX: (719) 488-9095; http://www.edram.com  
The information contained herein is subject to change without notice.  
Revision 1.0  
Page 1 of 99  

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