0316409C 4M
x
412/10, 3.3V, SR. 0316169C 1M x 1612/8, 3.3V, SR. 0316809C 2M x 812/9, 3.3V, SR.
512Kx32
Preliminary Data Sheet
16Mbit Enhanced Synchronous DRAM
Overview
Features
• High Performance:
CAS latency = 2
• Programmable Burst Length: 1,2,4,8,full-page
-6
166
6
-7.5
133
7.5
-10
100
10
Units
MHz
ns
• Programmable Wrap Sequence, Sequential or
Interleaved
fCK
tCK2
tAC2
Clock Frequency
Clock Cycle
• Automatic and Controlled Precharge Command
• Hidden Precharge and Hidden Auto Refresh
• Self Refresh
Clock Access Time
4.2
4.5
5
ns
• 8Kbit SRAM Row Cache per Bank
• Supports Row Pipelining for Random Row
• Suspend Mode and Power Down Mode
• 2048 refresh cycles / 32ms
Reads of 4:1:1:1:2:1:1:1:2:1:1:1 @ 133MHz
• Pin Compatible with JEDEC Standard SGRAMs
• Single 3.3V ± 0.3V Power Supply
• JEDEC Superset Standard ESDRAM
• Programmable Caching Policy
• LVTTL and 2.5V I/O Interface with Flexible VDDQ
• Package: 100 pin LQFP (0.65 mm pin pitch)
• Programmable CAS Latency: 1, 2, 3
• Dual Banks controlled by A10 (Bank Select)
Description
the user to perform operations on the DRAM array
concurrent with cache reads. These operations
include new row activation, precharge, and refresh-
ing the DRAM array. Since new row activations can
occur during cache read cycles, it is possible for the
ESDRAM to pipeline random row reads, thus reduc-
ing the page miss latency to that of a page hit.
As a JEDEC superset standard, the Enhanced Syn-
chronous DRAM is an evolutionary modification to a
JEDEC standard Synchronous DRAM. The
ESDRAM incorporates changes to a standard
SDRAM which reduce the latency, increase the
bandwidth, and allow for concurrent operations to
the same bank. Even with these improvements in
performance and functionality, the Enhanced
SDRAM remains pin compatible with a JEDEC stan-
dard 512Kx32 SGRAM. As a result, this ESDRAM is
plug-compatible with an SGRAM and operates like a
standard SDRAM when used in an SDRAM applica-
tion.
This device is designed to comply with all JEDEC
standards set for SDRAM products, both electrically
and mechanically. All the control, address, and data
input/output circuits are synchronized with the posi-
tive edge of an externally supplied clock.
Prior to any access operation, the CAS latency,
burst length, burst sequence, and write caching pol-
icy must be programmed into the device by address
inputs A0-A10 during a Mode Register Set com-
mand cycle. The write policy is set as either Write
Transfer mode or No Write Transfer mode.
The 512Kx32 Enhanced Synchronous DRAM com-
bines a fast DRAM array with a 16Kbit SRAM cache.
The DRAM array is separated into two fully indepen-
dent 8Mbit DRAM banks with 8Kbits of SRAM cache
per bank. The SRAM cache is integrated into the
DRAM array as tightly coupled row registers. The
integrated cache provides several advantages. The
first advantage is high speed random column
accesses (<10ns). Another advantage is that
through the use of auto-precharge, the cache allows
This device supports Self Refresh mode, and oper-
ates with a single 3.3V ± 0.3V power supply. The
device is available in a 100 pin LQFP package.
©1999 Enhanced Memory Systems. All rights reserved.
Enhanced Memory Systems Inc., 1850 Ramtron Dr., Colo Spgs, CO 80921
PHONE: (800) 545-DRAM; FAX: (719) 488-9095; http://www.edram.com
The information contained herein is subject to change without notice.
Revision 1.0
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