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SLVG2.8 PDF预览

SLVG2.8

更新时间: 2024-01-26 19:16:30
品牌 Logo 应用领域
商升特 - SEMTECH 瞬态抑制器二极管电视光电二极管局域网
页数 文件大小 规格书
7页 81K
描述
EPD TVS⑩ Diodes For ESD and Latch-Up Protection

SLVG2.8 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:R-PDSO-G4Reach Compliance Code:compliant
ECCN代码:EAR99HTS代码:8541.10.00.50
风险等级:5.83外壳连接:ANODE
配置:SINGLE二极管元件材料:SILICON
二极管类型:TRANS VOLTAGE SUPPRESSOR DIODEJESD-30 代码:R-PDSO-G4
JESD-609代码:e0元件数量:1
端子数量:4封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):NOT SPECIFIED极性:UNIDIRECTIONAL
认证状态:Not Qualified最大重复峰值反向电压:2.8 V
子类别:Transient Suppressors表面贴装:YES
技术:ZENER端子面层:TIN LEAD
端子形式:GULL WING端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIEDBase Number Matches:1

SLVG2.8 数据手册

 浏览型号SLVG2.8的Datasheet PDF文件第1页浏览型号SLVG2.8的Datasheet PDF文件第2页浏览型号SLVG2.8的Datasheet PDF文件第3页浏览型号SLVG2.8的Datasheet PDF文件第4页浏览型号SLVG2.8的Datasheet PDF文件第6页浏览型号SLVG2.8的Datasheet PDF文件第7页 
SLVE2.8 & SLVG2.8  
PROTECTION PRODUCTS  
Applications Information (continued)  
EPD TVSCharacteristics  
I
PP  
The SLV series is constructed using Semtech’s propri-  
etary EPD technology. The structure of the EPD TVS is  
vastly different from the traditional pn-junction devices.  
At voltages below 5V, high leakage current and junction  
capacitance render conventional avalanche technology  
impractical for most applications. However, by utilizing  
the EPD technology, the SLVE2.8 & SLVG2.8 can  
effectively operate at 2.8V while maintaining excellent  
electrical characteristics.  
ISB  
IPT  
I R  
VBRR  
V
V
V
VC  
RWM  
SB  
PT  
I BRR  
The EPD TVS employs a complex nppn structure in  
contrast to the pn structure normally found in tradi-  
tional silicon-avalanche TVS diodes. The EPD mecha-  
nism is achieved by engineering the center region of  
the device such that the reverse biased junction does  
not avalanche, but will “punch-through” to a conduct-  
ing state. This structure results in a device with supe-  
rior dc electrical parameters at low voltages while  
maintaining the capability to absorb high transient  
currents.  
EPD TVS VI Characteristic Curve  
The IV characteristic curve of the EPD device is shown  
in Figure 1. The device represents a high impedance  
to the circuit up to the working voltage (VRWM). During a  
transient event, the device will begin to conduct as it is  
biased in the reverse direction. When the punch-  
through voltage (VPT) is exceeded, the device enters a  
low impedance state, diverting the transient current  
away from the protected circuit. When the device is  
conducting current, it will exhibit a slight “snap-back” or  
negative resistance characteristic due to its structure.  
This must be considered when connecting the device  
to a power supply rail. To return to a non-conducting  
state, the current through the device must fall below  
the snap-back current (approximately < 50mA).  
www.semtech.com  
2001 Semtech Corp.  
5

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