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SCANPSC110F

更新时间： 2024-02-16 09:20:47
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD 测试
页数 文件大小 规格书
25页 270K
描述
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

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SCANPSC110F 技术参数

生命周期：Obsolete包装说明：QFF,
Reach Compliance Code：unknownHTS代码：8542.31.00.01
风险等级：5.62JESD-30 代码：R-GDFP-F28
长度：18.8 mm端子数量：28
最高工作温度：125 °C最低工作温度：-55 °C
封装主体材料：CERAMIC, GLASS-SEALED封装代码：QFF
封装形状：RECTANGULAR封装形式：FLATPACK
认证状态：Not Qualified座面最大高度：2.29 mm
最大供电电压：5.5 V最小供电电压：4.5 V
标称供电电压：5 V表面贴装：YES
技术：CMOS温度等级：MILITARY
端子形式：FLAT端子节距：1.27 mm
端子位置：DUAL宽度：9.145 mm
uPs/uCs/外围集成电路类型：MICROPROCESSOR CIRCUITBase Number Matches：1

SCANPSC110F 数据手册

 浏览型号SCANPSC110F的Datasheet PDF文件第1页浏览型号SCANPSC110F的Datasheet PDF文件第2页浏览型号SCANPSC110F的Datasheet PDF文件第4页浏览型号SCANPSC110F的Datasheet PDF文件第5页浏览型号SCANPSC110F的Datasheet PDF文件第6页浏览型号SCANPSC110F的Datasheet PDF文件第7页 
TABLE 2. Detailed Pin Description Table  
Pin #  
Name  
TMSB  
I/O (Note 1)  
Description  
(SOIC & LCC)  
TTL Input w/Pull-Up Resistor  
10  
BACKPLANE TEST MODE SELECT: Controls sequencing  
through the TAP Controller of the SCANPSC110F Bridge. Also  
controls sequencing of the TAPs which are on the three (3) local  
scan chains.  
TDIB  
TTL Input w/Pull-Up Resistor  
12  
13  
BACKPLANE TEST DATA INPUT: All backplane scan data is  
supplied to the SCANPSC110F through this input pin.  
TDOB  
3-STATEable,  
BACKPLANE TEST DATA OUTPUT: This output drives test data  
from the SCANPSC110F and the local TAPs, back toward the scan  
master controller.  
32 mA/64 mA Drive,  
Reduced-Swing,  
Output  
TCKB  
TTL Schmitt Trigger Input  
11  
9
TEST CLOCK INPUT FROM THE BACKPLANE: This is the mas-  
ter clock signal that controls all scan operations of the  
SCANPSC110F and of the three (3) local scan ports.  
TRST  
S(0–5)  
TTL Input w/Pull-Up Resistor  
TTL Inputs  
TEST RESET: An asynchronous reset signal (active LOW) which  
initializes the SCANPSC110F logic.  
2, 3, 4,  
5, 6, 7  
SLOT IDENTIFICATION: The configuration of these six (6) pins is  
used to identify (assign a unique address to) each SCANPSC110F  
on the system backplane.  
OE  
TTL Input  
1
OUTPUT ENABLE for the Local Scan Ports, active LOW. When  
HIGH, this active-LOW control signal 3-STATEs all three local scan  
ports on the SCANPSC110F, to enable an alternate resource to  
access one or more of the three (3) local scan chains.  
TDOL(1–3) 3-STATEable,  
24 mA/24 mA  
15,19,  
24  
TEST DATA OUTPUTS: Individual output for each of the three (3)  
local scan ports.  
Drive Outputs  
TDIL(1–3) TTL Inputs w/Pull-Up  
Resistors  
18, 23,  
27  
TEST DATA INPUTS: Individual scan data input for each of the  
three (3) local scan ports.  
TMSL(1–3) 3-STATEable,  
24 mA/24 mA  
16, 20,  
25  
TEST MODE SELECT OUTPUTS: Individual output for each of the  
three (3) local scan ports. TMSL does not provide a pull-up resistor  
(which is assumed to be present on a connected TMS input, per  
the IEEE 1149.1 requirement)  
Drive Outputs  
TCKL(1–3) 3-STATEable,  
24 mA/24 mA  
17, 22,  
26  
LOCAL TEST CLOCK OUTPUTS: Individual output for each of  
the three (3) local scan ports. These are buffered versions of  
TCKB.  
Drive Output  
VCC  
Power Supply Voltage  
Ground potential  
8, 28  
Power supply pins, 5.0V ±10%.  
GND  
14, 21  
Power supply pins 0V.  
Note 1: All pins are active HIGH unless otherwise noted.  
3
www.fairchildsemi.com  
1234567...25

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