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S10420-1104-01 PDF预览

S10420-1104-01

更新时间: 2024-01-10 12:56:42
品牌 Logo 应用领域
HAMAMATSU 传感器换能器
页数 文件大小 规格书
10页 265K
描述
CCD Sensor, 2048 Horiz pixels, 16 Vert pixels, Rectangular, Through Hole Mount, DIP-24

S10420-1104-01 技术参数

是否Rohs认证: 符合生命周期:Active
Reach Compliance Code:unknown风险等级:5.68
主体宽度:10.41 mm主体高度:3.3 mm
主体长度或直径:38.1 mm水平像素:2048
外壳:CERAMIC安装特点:THROUGH HOLE MOUNT
最高工作温度:50 °C最低工作温度:-50 °C
封装形状/形式:RECTANGULAR像素大小:14X14 µm
灵敏度(V / lx.s):6.5 V/lx.s传感器/换能器类型:IMAGE SENSOR,CCD
光谱响应 (nm):200-1100表面贴装:NO
端接类型:SOLDER垂直像素:16
Base Number Matches:1

S10420-1104-01 数据手册

 浏览型号S10420-1104-01的Datasheet PDF文件第2页浏览型号S10420-1104-01的Datasheet PDF文件第3页浏览型号S10420-1104-01的Datasheet PDF文件第4页浏览型号S10420-1104-01的Datasheet PDF文件第5页浏览型号S10420-1104-01的Datasheet PDF文件第6页浏览型号S10420-1104-01的Datasheet PDF文件第7页 
CCD image sensors  
S11071/S10420-01 series  
Improved etaloning characteristics,  
High-speed type and low noise type available  
The S11071/S10420-01 series are back-thinned CCD image sensors designed for spectrometers. Two types consisting of  
a high-speed type (S11071 series) and low noise type (S10420-01 series) are available with improved etaloning charac-  
teristics. The S11071/S10420-01 series offer nearly at spectral response characteristics with high quantum efciency  
from the UV to near infrared region.  
Features  
Applications  
Improved etaloning characteristics  
Spectrometers, etc.  
High sensitivity over a wide spectral range and nearly  
at spectral response characteristics  
-
High CCD node sensitivity: 8 μV/e (S11071 series)  
-
6.5 μV/e (S10420-01 series)  
High full well capacity and wide dynamic range  
(with anti-blooming function)  
Pixel size: 14 × 14 μm  
Selection guide  
Readout speed  
max.  
Number of  
Type no.  
Number of effective  
pixels  
Image size  
Suitable  
driver circuit  
total pixels  
[mm (H) mm (V)]  
×
(MHz)  
S11071-1004  
1044 22  
1024 16  
14.336 0.224  
×
×
×
S11071-1006  
S11071-1104  
S11071-1106  
S10420-1004-01  
S10420-1006-01  
S10420-1104-01  
S10420-1106-01  
1044 70  
1024 64  
14.336 0.896  
28.672 0.224  
×
×
×
×
10  
C11288  
C11287  
2068 22  
2048 16  
×
×
2068 70  
2048 64  
28.672 0.896  
×
×
×
1044 22  
1024 16  
14.336 0.224  
×
×
×
1044 70  
1024 64  
14.336 0.896  
×
×
×
0.5  
2068 22  
2048 16  
28.672 0.224  
×
×
×
2068 70  
2048 64  
28.672 0.896  
×
×
×
Improved etaloning characteristics  
Etaloning is an interference phenomenon that occurs when the light  
incident on a CCD repeatedly reects between the front and back  
surfaces of the CCD while being attenuated, and causes alternately  
high and low sensitivity. When long-wavelength light enters a back-  
thinned CCD, etaloning occurs due to the relationship between the  
silicon substrate thickness and the absorption length. The S11071/  
S10420-01 series back-thinned CCDs have achieved a signicant im-  
provement in etaloning by using a unique structure that is unlikely  
to cause interference.  
Etaloning characteristics (typical example)  
(Ta=25 °C)  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
Etaloning-improved type  
Previous type  
10  
0
900 910 920 930 940 950 960 970 980 990 1000  
Wavelength (nm)  
KMPDB0284EB  
1
www.hamamatsu.com  

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