RT7249
Parameter
Symbol
Test Conditions
LIM = 10k
Min
2420
1595
1215
468
Typ
2580
1700
1295
520
Max
2740
1805
1375
572
Unit
R
RLIM = 15k
Current-Limit Threshold and
Short-Circuit Current, Out
Connect to GND
RLIM = 20k
IOS
mA
RLIM = 49.9k
RLIM = 210k
RLIM Shorted to IN
110
50
130
75
150
100
Response Time to Short
Circuit
tIOS
(Note 5)
--
2
--
s
--
--
--
10
10
--
--
--
mV
ms
IFAULT = 1mA
FAULT Output Low Voltage
FAULT Deglitch
Over Current Condition
VSW_IN = 5V, EN_SW = 0V
Discharge Resistance
100
Note 1. Stresses beyond those listed “Absolute Maximum Ratings” may cause permanent damage to the device. These are
stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in
the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may
affect device reliability.
Note 2. θJA is measured at TA = 25°C on a high effective thermal conductivity four-layer test board per JEDEC 51-7. θJC is
measured at the exposed pad of the package.
Note 3. Devices are ESD sensitive. Handling precaution is recommended.
Note 4. The device is not guaranteed to function outside its operating conditions.
Note 5. Guaranteed by design.
Copyright 2017 Richtek Technology Corporation. All rights reserved.
©
is a registered trademark of Richtek Technology Corporation.
DS7249-02 March 2017
www.richtek.com
7