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RN2965FS(TPL3) PDF预览

RN2965FS(TPL3)

更新时间: 2024-02-06 09:29:59
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
8页 171K
描述
Digital Transistors -50mA -20volts 6Pin 2.2K x 47Kohms

RN2965FS(TPL3) 技术参数

是否Rohs认证: 符合生命周期:Active
Reach Compliance Code:unknown风险等级:5.74
Base Number Matches:1

RN2965FS(TPL3) 数据手册

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RN2961FS~RN2966FS  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)  
RN2961FS,RN2962FS,RN2963FS  
RN2964FS,RN2965FS,RN2966FS  
Switching, Inverter Circuit, Interface Circuit and  
Unit: mm  
Driver Circuit Applications  
1.0±0.05  
0.8±0.05  
0.1±0.05  
0.1±0.05  
Two devices are incorporated into a fine pitch Small Mold (6 pin)  
package.  
1
6
5
Incorporating a bias resistor into a transistor reduces parts count.  
2
Reducing the parts count enable the manufacture of ever more  
compact equipment and save assembly cost.  
4
3
Complementary to RN1961FS~RN1966FS  
Equivalent Circuit and Bias Resistor Values  
(E1)  
1.EMIITTER1  
2.EMITTER2  
3.BASE2  
4.COLLECTOR2  
5.BASE1  
C
(E2)  
(B2)  
(C2)  
(B1)  
(C1)  
Type No.  
R1 (kΩ)  
R2 (kΩ)  
RN2961FS  
RN2962FS  
RN2963FS  
RN2964FS  
RN2965FS  
RN2966FS  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
R1  
fS6 6.COLLECTOR1  
B
22  
JEDEC  
JEITA  
47  
E
2.2  
4.7  
TOSHIBA  
2-1F1C  
Weight: 0.001 g (typ.)  
Equivalent Circuit  
(top view)  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 common)  
Characteristics  
Symbol  
Rating  
Unit  
6
5
4
Collector-base voltage  
V
V
20  
20  
V
V
CBO  
CEO  
RN2961FS~2966FS  
Collector-emitter voltage  
Emitter-base voltage  
Q2  
Q1  
RN2961FS~2964FS  
RN2965FS, 2966FS  
10  
V
V
EBO  
5  
Collector current  
I
50  
mA  
mW  
°C  
C
1
2
3
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
(Note 1)  
50  
C
RN2961FS~2966FS  
T
150  
j
T
stg  
55~150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Total rating  
1
2007-11-01  

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