Datasheet > RN2967FE(TPL3)

RN2967FE(TPL3)

更新时间： 2024-02-26 07:36:48

品牌	Logo	应用领域
东芝 - TOSHIBA		晶体管
页数	文件大小	规格书
6页	353K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),SOT-363VAR

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技术参数
数据手册

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RN2967FE(TPL3) 技术参数

是否Rohs认证：	不符合	生命周期：	Lifetime Buy
包装说明：	,	Reach Compliance Code：	unknown
风险等级：	5.88	最大集电极电流 (IC)：	0.1 A
最小直流电流增益 (hFE)：	80	元件数量：	2
极性/信道类型：	PNP	最大功率耗散 (Abs)：	0.1 W
子类别：	BIP General Purpose Small Signal	表面贴装：	YES
晶体管元件材料：	SILICON	Base Number Matches：	1

RN2967FE(TPL3) 数据手册

RN2967FE~RN2969FE

TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Bias Resistor Built-in Transistor)

RN2967FE,RN2968FE,RN2969FE

Switching, Inverter Circuit, Interface Circuit and

Unit: mm

Driver Circuit Applications

•

Two devices are incorporated into an Extreme-Super-Mini (6-pin)

package.

Incorporating a bias resistor into a transistor reduces parts count.

Reducing the parts count enables the manufacture of ever more

compact equipment and lowers assembly cost.

•

Complementary to RN1967FE~RN1969FE

Equivalent Circuit and Bias Resistor Values

Type No.

R1 (kΩ)

R2 (kΩ)

RN2967FE

RN2968FE

RN2969FE

JEDEC

―

JEITA

TOSHIBA

2-2N1A

Absolute Maximum Ratings (Ta = 25°C)

(Q1, Q2 common)

Weight: 3 mg (typ.)

Characteristics

Collector-base voltage

Symbol

Rating

−50

Unit

Equivalent Circuit

(top view)

CBO

CEO

Collector-emitter voltage

Emitter-base voltage

Collector current

−50

RN2967FE

RN2968FE

RN2969FE

−6

−7

EBO

−15

−100

100

°C

Collector power dissipation

Junction temperature

(Note 1)

150

Storage temperature range

−55~150

°C

stg

Note: Using continuously under heavy loads (e.g. the application of high

temperature/current/voltage and the significant change in temperature,

etc.) may cause this product to decrease in the reliability significantly

even if the operating conditions (i.e. operating

temperature/current/voltage, etc.) are within the absolute maximum

ratings.

Please design the appropriate reliability upon reviewing the Toshiba

Semiconductor Reliability Handbook (“Handling Precautions”/“Derating

Concept and Methods”) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

Note 1: Total rating

2011-01-19

12 3 4 5 6

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