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RN1414_07 PDF预览

RN1414_07

更新时间: 2024-09-28 04:07:47
品牌 Logo 应用领域
东芝 - TOSHIBA 开关驱动PC
页数 文件大小 规格书
8页 184K
描述
Silicon NPN Epitaxial Type (PCT Process) Switching, Inverter Circuit, Interface Circuit And Driver Circuit Applications

RN1414_07 数据手册

 浏览型号RN1414_07的Datasheet PDF文件第2页浏览型号RN1414_07的Datasheet PDF文件第3页浏览型号RN1414_07的Datasheet PDF文件第4页浏览型号RN1414_07的Datasheet PDF文件第5页浏览型号RN1414_07的Datasheet PDF文件第6页浏览型号RN1414_07的Datasheet PDF文件第7页 
RN1414RN1418  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
RN1414, RN1415, RN1416,RN1417, RN1418  
Switching, Inverter Circuit, Interface Circuit  
And Driver Circuit Applications  
Unit: mm  
z With built-in bias resistors  
z Simplified circuit design  
z Reduced number of parts and simplified manufacturing process  
z Complementary to RN2414~RN2418  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN1414  
RN1415  
RN1416  
RN1417  
RN1418  
1
10  
10  
10  
4.7  
10  
2.2  
4.7  
10  
47  
JEDEC  
SC-236MOD  
EIAJ  
SC-59  
TOSHIBA  
Weight: 0.012g  
2-3F1A  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN1414~1418  
Collector-emitter voltage  
RN1414  
RN1415  
RN1416  
RN1417  
RN1418  
5
6
Emitter-base voltage  
V
V
7
EBO  
15  
25  
Collector current  
I
100  
200  
150  
55~150  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C
RN1414~1418  
T
j
T
stg  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2007-11-01  

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