THE PULSE OF THE FUTURE
PVX-2505
50V, 10A PRECISION PULSED I-V PULSE GENERATOR
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Output Voltage To +50V
Output Current To 10A
50% Maximum Duty Cycle
Pulse widths from <1mS to 100mS
Instrument-quality analog voltage
and current monitors for data
acquisition
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Designed for precision pulsing of
semiconductor devices for
pulsed I-V characterization
The PVX-2505 pulse generator is designed for pulsed I-V
(current-voltage) characterization of semiconductor
devices at up to 50 Volts and 10 Amps. It is also well
suited for other applications requiring high current,
precision voltage pulses.
A quiescent (bias) voltage may be applied to the pulse
generator, allowing the DUT to be held at a voltage other
than zero, then pulsed above or below this voltage.
The PVX-2505 requires an input gate signal, pulse
(VHIGH) and optional quiescent (VLOW) DC power supply
inputs. The output pulse width and frequency are controlled
by the input gate signal. The output voltage amplitude is
controlled by the amplitude of the input VHIGH and optional
VLOW DC power supply amplitudes.
The I-V characteristics of semiconductor devices are
functions of frequency and temperature. Curve tracers
and other "DC" test systems typically step through a
range of gate voltages and, at each gate voltage, sweep
the drain voltage over the measurement range. The
device essentially reaches thermal equilibrium and
electronic (semiconductor-trap) equilibrium at each point,
yielding different test characteristics than actual RF
operational characteristics.
The front panel controls and monitors provide the flexibility
to operate in pulsed mode, or to switch to DC mode, in
which the DC voltage generated by the VHIGH power
supply is applied directly to the DUT. Integral instrument-
quality voltage and current probes are provided to facilitate
pulse data acquisition.
By pulsing the device using the PVX-2505 and taking a
measurement during the pulse, the measurements can be
taken before the device heats up. This circumvents the
thermal effects associated with conventional "DC" testing,
more closely approximates the characteristics of the
device when operating at high frequencies, and doesn't
activate the semiconductor "traps".
The output pulse is launched on an innovative, low-
impedance cable. The design of this cable maintains the
fidelity of the output pulse without introducing pulse
distortion or ringing, and provides a convenient means of
connecting the pulse generator to the DUT or bias tee.
The pulse generator is a direct-coupled, air-cooled solid-
state design, offering equally fast pulse rise and fall times,
low power dissipation, and minimal over-shoot, under-shoot
or ringing. It has over-current detection and shut-down
circuitry to protect the pulse generator from potential
damage due to arcs and shorts in the load or interconnect
cable.
The PVX-2505 is designed using a bi-directional
MOSFET output stage using DEI’s DE-Series Fast Power
MOSFETs. This design provides fast rise and fall times,
with minimal overshoot, undershoot and ringing and fast
settling times. This controlled voltage waveform allows
the device under test (DUT) to stabilize at voltage within a
few hundred nanoseconds, allowing I-V measurements to
be made before device heating begins.
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