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PJQ1900 PDF预览

PJQ1900

更新时间: 2022-02-26 14:37:11
品牌 Logo 应用领域
强茂 - PANJIT /
页数 文件大小 规格书
6页 333K
描述
20V N-Channel Enhancement Mode MOSFET

PJQ1900 数据手册

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PPJQ1900  
Electrical Characteristics (TA=25oC unless otherwise noted)  
PARAMETER  
SYMBOL  
TEST CONDITION  
MIN.  
TYP.  
MAX.  
UNITS  
Static  
Drain-Source Breakdown Voltage  
Gate Threshold Voltage  
BVDSS  
VGS(th)  
VGS=0V, ID=250uA  
VDS=VGS, ID=250uA  
VGS=4.5V, ID=600mA  
VGS=2.5V, ID=200mA  
VGS=1.8V, ID=100mA  
VGS=1.5V, ID=50mA  
VGS=1.2V, ID=20mA  
VDS=16V, VGS=0V  
VGS=+8V, VDS=0V  
20  
-
-
V
V
0.3  
0.65  
300  
350  
400  
500  
1000  
-
0.9  
-
-
-
-
-
-
-
400  
650  
800  
1200  
3000  
1
Drain-Source On-State Resistance  
RDS(on)  
mΩ  
Zero Gate Voltage Drain Current  
Gate-Source Leakage Current  
Dynamic (Note 6)  
IDSS  
IGSS  
uA  
uA  
+0.5  
+10  
Total Gate Charge  
Qg  
Qgs  
Qgd  
Ciss  
Coss  
Crss  
td(on)  
tr  
-
-
-
-
-
-
-
-
-
-
1.4  
0.22  
0.21  
67  
-
-
-
-
-
-
-
-
-
-
VDS=10V, ID=300mA,  
VGS=4.5V (Note 2)  
Gate-Source Charge  
Gate-Drain Charge  
nC  
pF  
Input Capacitance  
VDS=10V, VGS=0V,  
f=1.0MHZ  
Output Capacitance  
19  
Reverse Transfer Capacitance  
Turn-On Delay Time  
6
2.8  
20  
VDD=10V, ID=150mA,  
VGS=4.0V,  
RG=10Ω (Note 1,2)  
Turn-On Rise Time  
ns  
Turn-Off Delay Time  
td(off)  
tf  
23  
Turn-Off Fall Time  
23  
Drain-Source Diode  
Maximum Continuous Drain-Source  
Diode Forward Current  
IS  
---  
-
-
-
300  
1.3  
mA  
V
Diode Forward Voltage  
VSD  
IS=300mA, VGS=0V  
0.87  
NOTES :  
1. Pulse width<300us, Duty cycle<2%  
2. Essentially independent of operating temperature typical characteristics.  
3. Tsp is the temperature at the soldering point of the source lead.  
4. RJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is  
defined as the solder mounting surface of the drain pins mounted on a 1inch FR-4 with 2oz. square pad of copper.  
5. The maximum current rating is package limited  
6. Guaranteed by design, not subject to production testing.  
August 28,2015-REV.00  
Page 2  

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