PDM41024
Low V Data Retention Waveform
CC
Data Retention Mode
V
4.5V
4.5V
CC
V
DR
t
t
CDR
R
V
V
DR
IH
CE1
CE2
V
IL
DON'T CARE
V
IH
≤ 0.2V
V
IL
Data Retention Electrical Characteristics (LA Version Only) for JEDEC Version
Symbol Parameter
for Retention Data
Test Conditions
Min.
Typ.
Max.
Unit
V
V
2
—
—
—
—
V
DR
CC
I
Data Retention Current
CE1 ≥ V – 0.2V or
V
V
= 2V
= 3V
—
—
500
750
µA
µA
CCDR
CC
CC
CE2 ≤ V + 0.2V
SS
CC
V
≥ V – 0.2V
IN
CC
or ≤ 0.2V
t
Chip Deselect to Data Retention Time
Operation Recovery Time
0
—
—
—
—
ns
ns
CDR
(3)
t
t
RC
R
NOTES: (For three previous Electrical Characteristics tables)
1. The parameter is tested with CL = 5 pF as shown in Figure 2. Transition is measured ±200 mV from steady state voltage.
2. At any given temperature and voltage condition, t
3. This parameter is sampled.
is less than t
.
HZCE
LZCE
4. WE is high for a READ cycle.
5. The device is continuously selected. All the Chip Enables are held in their active state.
6. The address is valid prior to or coincident with the latest occurring Chip Enable.
7. Vcc = 5V ± 5%.
Ordering Information
XXXXX
X
XX
Speed
X
X
X
Device Type Power
Package
Type
Process
Temp. Range
Preferred
Shipping
Container
Blank Tubes
TR
TY
Tape & Reel
Tray
Blank
I
A
Commercial (0° to +70°C)
Industrial (-40° to +85°C)
Automotive (-40° to +105°C)
TSO 32-pin 300-mil Plastic SOJ
SO
T
32-pin 400-mil Plastic SOJ
32-pin Plastic TSOP (I)
10
12
15
Commercial Only
(use 15 ns for slower designs)
SA
LA
Standard Power
Low Power
PDM41024 - 1 Meg (128Kx8) Static RAM
8
4/09/98 - Rev. 3.3