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P4C164L-80P6ILF

更新时间： 2025-07-15 03:06:07

品牌	Logo	应用领域
PYRAMID		/
页数	文件大小	规格书
11页	112K
描述
LOW POWER 8K x 8 STATIC CMOS RAM

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P4C164L-80P6ILF 数据手册

P4C164L

RECOMMENDED OPERATING TEMPERATURE & SUPPLY VOLTAGE

Temperature Range (Ambient)

Commercial (0°C to 70°C)

Supply Voltage

4.5V ≤ V_CC≤ 5.5V

4.5 ≤ V_CC≤ 5.5V

Industrial (-40°C to 85°C)

MAXIMUM RATINGS⁽¹⁾

Stresses greater than those listed can cause permanent damage to the device. These are absolute stress ratings

only. Functional operation of the device is not implied at these or any other conditions in excess of those given in

the operational sections of this data sheet. Exposure to Maximum Ratings for extended periods can adversely

affect device reliability.

Symbol

V_CC

Parameter

Supply Voltage with Respect to GND

Terminal Voltage with Respect to GND (up to 7.0V)

OperatingAmbient Temperature

Min

-0.5

Max

7.0

Unit

V_TERM

V_CC+ 0.5

-55

-65

125

150

°C

S_TG

I_OUT

I_LAT

Storage Temperature

Output Current into Low Outputs

Latch-up Current

>200

DC ELECTRICAL CHARACTERISTICS

(Over Recommended Operating Temperature & Supply Voltage)⁽²⁾

Max

Parameter

Unit

Min

Symbol

Test Conditions

Output High Voltage

(I/O₀- I/O₇)

V_OH

I_OH= –1mA, V_CC= 4.5V

2.4

I_OL= 2.1mA

0.4

V_OL

Output Low Voltage

(I/O₀- I/O₇)

2.2

V_CC+ 0.3

0.8

V_IH

V_IL

Input High Voltage

Input Low Voltage

-0.5⁽³⁾

Input Leakage Current

I_LI

µA

GND ≤ V_IN≤ V_CC

Ind./Com.

-2

GND ≤ V_OUT≤ V_CCInd./Com.

CE ≥ V_IH

I_LO

Output Leakage Current

I_SB

V_CC= 5.5V, I_OUT= 0 mA

V_CCCurrent

TTLStandby Current

(TTL Input Levels)

µA

100

CE₁= V_IHor CE₂= V_IL

V_CCCurrent

V_CC= 5.5V, I_OUT= 0 mA

I_SB1

CMOS Standby Current

(CMOS Input Levels)

CE₁≥ V_CC-0.2V or CE₂≤ 0.2V

Notes:

2. Extended temperature operation guaranteed with 400 linear feet per

minute of air flow.

3. Transient inputs with V_ILand I_ILnot more negative than –3.0V and

–100mA, respectively, are permissible for pulse widths up to 20ns.

4. This parameter is sampled and not 100% tested.

1. Stresses greater than those listed under MAXIMUM RATINGS may

cause permanent damage to the device. This is a stress rating only

and functional operation of the device at these or any other conditions

above those indicated in the operational sections of this specification

is not implied. Exposure to MAXIMUM rating conditions for extended

periods may affect reliability.

Document # SRAM116 REV B

Page 2 of 11

123 4 5 6 7...11

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