P4C164 - ULTRA HIGH SPEED 8K x 8 STATIC CMOS RAM
MAꢁIMUM RATIꢀGS(1)
RECOMMEꢀDED OPERATIꢀG COꢀDITIOꢀS
Sym Parameter
Value
Unit
Grade(2)
Ambient Temp
0°C to 70°C
GꢀD
0V
VCC
Power Supply Pin with
VCC
Commercial
Industrial
Military
5.0V ± 10%
5.0V ± 10%
5.0V ± 10%
-0.5 to +7
V
Respect to GND
-40°C to +85°C
-55°C to +125°C
0V
Terminal Voltage with
VTERM Respect to GND (up to
7.0V)
-0.5 to VCC + 0.5
V
0V
CAPACITAꢀCES(4)
TA
Operating Temperature
-55 to +125
-55 to +125
-65 to +150
1.0
°C
°C
°C
W
(VCC = 5.0V, TA = 25°C, f = 1.0MHz)
TBIAS Temperature Under Bias
TSTG Storage Temperature
Sym Parameter
Conditions Typ Unit
PT
Power Dissipation
CIN
Input Capacitance
VIN=0V
5
7
pF
pF
IOUT DC Output Current
50
mA
COUT
Output Capacitance
VOUT=0V
DC ELECTRICAL CHARACTERISTICS
(Over Recommended Operating Temperature & Supply Voltage)(2)
P4C164
P4C164L
Sym Parameter
Test Conditions
Unit
Min
2.2
Max
Min
2.2
Max
VCC + 0.5
0.8
VIH
VIL
Input High Voltage
Input Low Voltage
VCC + 0.5
0.8
V
V
V
V
V
V
V
-0.5(3)
VCC - 0.2
-0.5(3)
-0.5(3)
VCC - 0.2
-0.5(3)
VHC CMOS Input High Voltage
VLC CMOS Input Low Voltage
VCC + 0.5
0.2
VCC + 0.5
0.2
VCD Input Clamp Diode Voltage
VCC = Min, IIN = -18 mA
IOL = +8 mA, VCC = Min
-1.2
-1.2
VOL Output Low Voltage (TTL Load)
0.4
0.4
VOH Output High Voltage (TTL Load) IOH = -4 mA, VCC = Min
2.4
-10
-5
2.4
-5
MIL
IND/COM
MIL
+10
+5
+5
N/A
+5
VCC = Max,
VIN = GND to VCC
ILI
Input Leakage Current
Output Leakage Current
µA
µA
N/A
-5
-10
-5
+10
+5
VCC = Max, CE1 = VIH,
VOUT = GND to VCC
ILO
IND/COM
MIL
N/A
—
N/A
40
—
40
CE1 ≥ VIH or CE2 ≤ VIL,
Standby Power Supply Current
(TTL Input Levels)
ISB
mA
VCC=Max, f=Max, Outputs Open
IND/COM
—
30
—
N/A
CE1 ≥ VHC or CE2 ≤ VLC,
VCC = Max, f = 0, Outputs Open
VIN ≤ VLC or VIN ≥ VHC
MIL
—
—
25
15
—
—
1
Standby Power Supply Current
(CMOS Input Levels)
ISB1
mA
IND/COM
N/A
N/A = Not applicable
ꢀotes:
2. Extended temperature operation guaranteed with 400 linear feet per
minute of air flow.
3. Transient inputs with VIL and IIL not more negative than –3.0V and
–100mA, respectively, are permissible for pulse widths up to 20ns.
4. This parameter is sampled and not 100% tested.
1. Stresses greater than those listed under MAꢀIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification
is not implied. Exposure to MAꢀIMUM rating conditions for extended
periods may affect reliability.
Document # SRAM115 REV H
Page 2