Datasheet > N9201A

N9201A

更新时间： 2024-09-29 05:51:55

品牌	Logo	应用领域
安捷伦 - AGILENT		测试
页数	文件大小	规格书
4页	111K
描述
Array Structure Parametric Test Option

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Agilent N9201A

Array Structure Parametric Test Option

Technical Overview

Introduction

The Agilent N9201A Parametric Test

Option offers high throughput para-

metric measurement capability for

a variety of addressable array test

structures (e.g. passive array, active

The N9201A is able to provide a

The decreasing size of features on

integrated circuits (45 nm and smaller)

is driving the need for new parametric

test capabilities. These capabilities

must accommodate the advanced test

structures developed for fast yield

ramp up in process integration as well

as process monitoring in semiconduc-

tor manufacturing.

maximum of 48 signal lines using the

extended path ports of the 4070/4080

test head. This can be any combina-

tion of available SMUs, digital outputs,

array and clocked latched active array) and DC power source outputs. The

with synchronized mixed operation of

DC SMUs and digital outputs. Digital

outputs (parallel, serial, or clock sig-

nals) are used for the address decoder

that is built into addressable array test

structures. This allows the selection

of the speciﬁc array element to be

measured. DC SMUs measure the DC

voltage and current parameters of

selected array elements.

signals pass through the 4070/4080

test head down to the probe card.

The N9201A is controlled by SPECS

(Semiconductor Process Evaluation

Core Software), a test shell environ-

ment for the 4070 Series and 4080

Series. The N9201A can be provided

as an upgrade for existing 4070 Series

and 4080 Series users.

High-throughput measurement of high-

volume parametric data is required to

shorten the time for ramping up the

process yield. This is accomplished by

statistically analyzing and correcting

the cause of wide range of process

performance variations across a 300

mm wafer. Advanced test structures,

addressable array test structures that

contain address decoder circuitry, and

a large number of test array elements

with fewer probing pads and silicon

area have been developed by major

semiconductor manufacturers for this

purpose.

The DC power source is used for

applying the power supply voltage (Vdd)

to the address decoder logic circuitry

that is built-in the addressable array

test structures.

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与N9201A相关器件

型号	品牌	获取价格	描述	数据表
N92050C	SEOUL	获取价格	Single Color LED, Warm White, T-1, 3mm, ROHS COMPLIANT, SMD, 2 PIN
N9260M	ETC	获取价格	Analog IC
N93003	STMICROELECTRONICS	获取价格	High voltage fast-switching PNP power transistor
N9301B	NXP	获取价格	IC 93 SERIES, DECIMAL DECODER/DRIVER, INVERTED OUTPUT, PDIP16, Decoder/Driver
N9309B	NXP	获取价格	IC 93 SERIES, DUAL 4 LINE TO 1 LINE MULTIPLEXER, COMPLEMENTARY OUTPUT, PDIP16, Multiplexer
N9309F	NXP	获取价格	IC 93 SERIES, DUAL 4 LINE TO 1 LINE MULTIPLEXER, COMPLEMENTARY OUTPUT, CDIP16, Multiplexer
N9312B	NXP	获取价格	IC 93 SERIES, 8 LINE TO 1 LINE MULTIPLEXER, COMPLEMENTARY OUTPUT, PDIP16, Multiplexer/Demu
N9312F	NXP	获取价格	IC 93 SERIES, 8 LINE TO 1 LINE MULTIPLEXER, COMPLEMENTARY OUTPUT, CDIP16, Multiplexer/Demu
N9314F	PHILIPS	获取价格	D Latch, 1-Func, 4-Bit, TTL, CDIP16
N9314N	PHILIPS	获取价格	D Latch, 1-Func, 4-Bit, TTL, PDIP16

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