¡ Semiconductor
MSM548263
Notes: 1. Exposure beyond the "Absolute Maximum Ratings" may cause permanent damage
to the device.
2. All voltages are referenced to V .
SS
3. These parameters depend on the cycle rate.
4. Theseparametersdependonoutputloading.Specifiedvaluesareobtainedwiththe
output open.
5. An initial pause of 200 ms is required after power up followed by any 8 RAS cycles
(TRG = "high") and any 8 SC cycles before proper device operation is achieved.
In the case of using an internal refresh counter, a minimum of 8 CAS before RAS
cycles instead of 8 RAS cycles are required.
6. AC measurements assume t = 5 ns.
T
7. V (Min.)andV (Max.)arereferencelevelsformeasuringtimingofinputsignals.
IH
IL
Also, transition times are measured between V and V .
IH
IL
8. RAM port outputs are measured with a load equivalent to 1 TTL load and 50 pF.
DOUT reference levels : V /V = 2.0 V/0.8 V.
OH
OL
9. SAM port outputs are measured with a load equivalent to 1 TTL load and 30 pF.
DOUT reference levels : V /V = 2.0 V/0.8 V.
OH
OL
10. t
(Max.), t
(Max.), t
(Max.) and t
(Max.) define the time at which the
OFF
OEZ
SDZ
SEZ
outputsachievetheopencircuitcondition, andarenotreferencedtooutputvoltage
levels. This parameter is sampled and not 100% tested.
11. Either t
or t
must be satisfied for a read cycle.
RCH
RRH
12. These parameters are referenced to CAS leading edge of early write cycles, and to
WE leading edge in TRG controlled write cycles and read modify write cycles.
13. t
, t
, t
and t
are not restrictive operating parameters.
AWD
WCS RWD CWD
They are included in the data sheet as electrical characteristics only.
If t ≥ t (Min.), the cycle is an early write cycle, and the data out pin will
WCS
WCS
remain open circuit throughout the entire cycle; If t
≥t
(Min.), t
≥t
RWD RWD
CWD CWD
(Min.) and t
≥ t
(Min.), the cycle is a read modify write cycle, and the data
AWD AWD
out will contain data read from the selected cell; If neither of the above sets of
conditions are satisfied, the condition of the data out is indeterminate.
14. Operation within the t
(Max.) limit ensures that t
(Max.) can be met.
RCD
RAC
t
(Max.)isspecifiedasareferencepointonly:Ift
(Max.) limit, then access time is controlled by t
isgreaterthanthespecified
RCD
RCD
t
.
RCD
CAC
15. Operation within the t
(Max.) limit ensures that t
(Max.) can be met. t
RAD
RAC
RAD
RAD
(Max.)isspecifiedasareferencepointonly:Ift
isgreaterthanthespecifiedt
RAD
(Max.) limit, then access time is controlled by t
16. Input levels at the AC testing are 3.0 V/0 V.
.
AA
17. Address (A0 - A8) may be changed two times or less while RAS = V .
IL
18. Address (A0 - A8) may be changed once or less while CAS = V and RAS = V .
IH
IL
19. This is guaranteed by design. (t
/t
= t
/t
- output transition time)
SOH COH
SCA CAC
This parameter is not 100% tested.
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