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ML5243

更新时间: 2023-09-03 20:33:02
品牌 Logo 应用领域
罗姆 - ROHM 电池监控测试
页数 文件大小 规格书
28页 1666K
描述
支持3~5节电池、具有电池电压、电流、温度和断线检测功能的电池监控保护LSI电池电压检测过电流检测温度检测断线检测充放电许可信号输出短路电流检测省时测试模式

ML5243 数据手册

 浏览型号ML5243的Datasheet PDF文件第4页浏览型号ML5243的Datasheet PDF文件第5页浏览型号ML5243的Datasheet PDF文件第6页浏览型号ML5243的Datasheet PDF文件第8页浏览型号ML5243的Datasheet PDF文件第9页浏览型号ML5243的Datasheet PDF文件第10页 
FEDL5243_001-04  
ML5243  
Code001: Detection Delay and Monitor Cycle Characteristics (Ta = 0 to 60 °C)  
VDD=18 V, GND=0 V, Ta=0 to 60°C  
Item  
Symbol  
tDET  
Condition  
Min.  
300  
Typ.  
400  
Max.  
500  
Unit  
ms  
Cell voltage monitor cycle  
Overvoltage detection delay  
2nd Overvoltage detection  
delay  
tOV  
5×tDET  
6×tDET  
ms  
tSOV  
tUV  
20×tDET  
5×tDET  
9×tDET  
21×tDET  
6×tDET  
ms  
ms  
ms  
Undervoltage detection delay  
Open-wire detection/release  
delay  
tOW  
10×tDET  
Discharge overcurrent  
detection delay  
tOCU  
250  
50  
500  
100  
750  
150  
ms  
ms  
Charge overcurrent detection  
delay  
tOCO  
tSHRT  
tPT  
Short circuit detection delay  
Temperature monitor cycle  
Temperature measurement  
time  
0.2  
0.5  
1.0  
ms  
ms  
300  
400  
500  
tTM  
1.9  
3.9  
5.5  
ms  
ms  
Temperature  
detection/release delay  
tTDR  
1×tPT  
2×tPT  
Discharge  
overcurrent state,  
short circuit state  
Charge overcurrent  
state  
Load removal detection delay  
tORL  
50  
100  
150  
ms  
Charger removal detection  
delay  
tOCHG  
tDETT  
tOVT  
50  
75  
0
100  
100  
150  
ms  
ms  
ms  
ms  
ms  
ms  
ms  
Cell voltage monitor cycle  
for test mode  
TEST pin = H,  
Ta=25°C  
125  
Overvoltage detection delay  
for test mode  
2nd Overvoltage detection  
delay for test mode  
Undervoltage detection delay  
for test mode  
TEST pin = H,  
Ta=25°C  
1×tDETT  
1×tDETT  
1×tDETT  
1×tDETT  
125  
T TEST pin = H,  
Ta=25°C  
tSOVT  
tUVT  
tOWT  
tPTT  
0
TEST pin = H,  
Ta=25°C  
0
Open-wire detection/release  
delay for test mode  
Temperature monitor cycle  
for test mode  
TEST pin = H,  
Ta=25°C  
0
TEST pin = H,  
Ta=25°C  
75  
100  
Temperature  
detection/release delay  
for test mode  
TEST pin = H,  
tTDRT  
0
1×tPTT  
ms  
Ta=25°C  
7/28  

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