Datasheet > MAX2682EUT

MAX2682EUT

更新时间： 2024-02-26 01:46:46

品牌	Logo	应用领域
其他 - ETC		射频微波
页数	文件大小	规格书
7页	57K
描述
PLASTIC ENCAPSULATED DEVICES

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技术参数
数据手册

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MAX2682EUT 技术参数

是否无铅：	含铅	生命周期：	Active
Reach Compliance Code：	unknown	风险等级：	5.64
Is Samacsys：	N	特性阻抗：	50 Ω
下变频增益-最小值：	8.7 dB	最大中频频率：	500 MHz
最小中频频率：	10 MHz	JESD-609代码：	e0
LO 可调谐：	YES	最高工作温度：	85 °C
最低工作温度：	-40 °C	最大射频输入频率：	2500 MHz
最小射频输入频率：	400 MHz	射频/微波设备类型：	DOWN CONVERTER
端子面层：	TIN LEAD	最大电压驻波比：	1.5
Base Number Matches：	1

MAX2682EUT 数据手册

V. Quality Assurance Information

A. Quality Assurance Contacts: Jim Pedicord

Bryan Preeshl

(Reliability Lab Manager)

(Executive Director of QA)

Kenneth Huening (Vice President)

B. Outgoing Inspection Level: 0.1% for all electrical parameters guaranteed by the Datasheet.

0.1% For all Visual Defects.

C. Observed Outgoing Defect Rate: < 50 ppm

D. Sampling Plan: Mil-Std-105D

VI. Reliability Evaluation

A. Accelerated Life Test

The results of the 150°C biased (static) life test are shown in Table 1. Using these results, the Failure

Rate (l ) is calculated as follows:

l =

1.83

(Chi square value for MTTF upper limit)

MTTF

192 x 9823 x 45 x 2

Temperature Acceleration factor assuming an activation energy of 0.8eV

l = 10.78 x 10^-8

l = 10.78 F.I.T. (60% confidence level @ 25°C)

This low failure rate represents data collected from Maxim’s reliability qualification and monitor programs.

Maxim also performs weekly Burn-In on samples from production to assure reliability of its processes. The

reliability required for lots which receive a burn-in qualification is 59 F.I.T. at a 60% confidence level, which equates

to 3 failures in an 80 piece sample. Maxim performs failure analysis on rejects from lots exceeding this level. The

aBurn-In Schematic shows the static circuit used for this test. Maxim also performs 1000 hour life test monitors

quarterly for each process. This data is published in the Product Reliability Report (RR-1M).

B. Moisture Resistance Tests

Maxim evaluates pressure pot stress from every assembly process during qualification of each new design.

Pressure Pot testing must pass a 20% LTPD for acceptance. Additionally, industry standard 85°C/85%RH or

HAST tests are performed quarterly per device/package family.

C. E.S.D. and Latch-Up Testing

The WR22-2 die type has been found to have all pins able to withstand a transient pulse of <250V, per Mil-

Std-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device

withstands a current of ±50mA.

1 2 345 6 7

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