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M27C405-120K6 PDF预览

M27C405-120K6

更新时间: 2024-01-18 05:33:16
品牌 Logo 应用领域
意法半导体 - STMICROELECTRONICS 可编程只读存储器
页数 文件大小 规格书
14页 147K
描述
512KX8 OTPROM, 120ns, PQCC32, PLASTIC, LCC-32

M27C405-120K6 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:QFJ包装说明:PLASTIC, LCC-32
针数:32Reach Compliance Code:not_compliant
ECCN代码:EAR99HTS代码:8542.32.00.71
风险等级:5.92Is Samacsys:N
最长访问时间:120 nsI/O 类型:COMMON
JESD-30 代码:R-PQCC-J32JESD-609代码:e0
长度:13.995 mm内存密度:4194304 bit
内存集成电路类型:OTP ROM内存宽度:8
功能数量:1端子数量:32
字数:524288 words字数代码:512000
工作模式:ASYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:512KX8
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:QCCJ封装等效代码:LDCC32,.5X.6
封装形状:RECTANGULAR封装形式:CHIP CARRIER
并行/串行:PARALLEL峰值回流温度(摄氏度):NOT SPECIFIED
电源:5 V认证状态:Not Qualified
座面最大高度:3.56 mm最大待机电流:0.0001 A
子类别:OTP ROMs最大压摆率:0.03 mA
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:J BEND
端子节距:1.27 mm端子位置:QUAD
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:11.4554 mm
Base Number Matches:1

M27C405-120K6 数据手册

 浏览型号M27C405-120K6的Datasheet PDF文件第3页浏览型号M27C405-120K6的Datasheet PDF文件第4页浏览型号M27C405-120K6的Datasheet PDF文件第5页浏览型号M27C405-120K6的Datasheet PDF文件第7页浏览型号M27C405-120K6的Datasheet PDF文件第8页浏览型号M27C405-120K6的Datasheet PDF文件第9页 
M27C405  
(1)  
Table 8B. Read Mode AC Characteristics  
(T = 0 to 70°C or –40 to 85°C; V = 5V ± 10%; V = V  
)
A
CC  
PP  
CC  
M27C405  
-120  
Symbol  
Alt  
Parameter  
Test Condition  
-100  
-150  
Unit  
Min Max Min Max Min Max  
t
t
E = V , G = V  
Address Valid to Output Valid  
Chip Enable Low to Output Valid  
Output Enable Low to Output Valid  
100  
100  
50  
120  
120  
60  
150 ns  
150 ns  
AVQV  
ACC  
IL  
IL  
t
t
G = V  
IL  
ELQV  
CE  
t
t
E = V  
IL  
60  
50  
50  
ns  
ns  
ns  
GLQV  
OE  
(2)  
t
t
G = V  
Chip Enable High to Output Hi-Z  
Output Enable High to Output Hi-Z  
0
0
30  
30  
0
0
40  
40  
0
0
t
DF  
DF  
IL  
EHQZ  
(2)  
E = V  
t
IL  
GHQZ  
Address Transition to Output  
Transition  
t
t
E = V , G = V  
IL IL  
0
0
0
ns  
AXQX  
OH  
Note: 1. V must be applied simultaneously with or before V and removed simultaneously or after V .  
PP  
CC  
PP  
2. Sampled only, not 100% tested  
Figure 5. Read Mode AC Waveforms  
VALID  
tGLQV  
VALID  
A0-A18  
tAVQV  
tAXQX  
E
tEHQZ  
tGHQZ  
G
tELQV  
Hi-Z  
Q0-Q7  
AI00724B  
System Considerations  
The power switching characteristics of Advanced  
CMOS EPROMs require careful decoupling of the  
output control and by properly selected decoupling  
capacitors. It is recommended that a 0.1µF ceram-  
ic capacitor be used on every device between V  
CC  
and V . This should be a high frequency capaci-  
SS  
devices. The supply current, I , has three seg-  
CC  
tor of low inherent inductance and should be  
placed as close to the device as possible. In addi-  
tion, a 4.7µF bulk electrolytic capacitor should be  
ments that are of interest to the system designer:  
the standby current level, the active current level,  
and transient current peaks that are produced by  
the falling and rising edges of E. The magnitude of  
the transient current peaks is dependent on the  
capacitive and inductive loading of the device at  
the output. The associated transient voltage peaks  
can be suppressed by complying with the two line  
used between V and V for every eight devic-  
CC  
SS  
es. The bulk capacitor should be located near the  
power supply connection point. The purpose of the  
bulk capacitor is to overcome the voltage drop  
caused by the inductive effects of PCB traces.  
6/14  

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