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LTC2990IMSPBF

更新时间： 2024-02-06 15:30:11
品牌 Logo 应用领域
凌特 - Linear 监视器
页数 文件大小 规格书
24页 284K
描述
I2C Temperature, Voltage and Current Monitor

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LTC2990IMSPBF 技术参数

是否Rohs认证： 符合生命周期：Transferred
零件包装代码：MSOP包装说明：TSSOP, TSSOP10,.19,20
针数：10Reach Compliance Code：compliant
ECCN代码：EAR99HTS代码：8542.39.00.01
风险等级：5.11可调阈值：NO
模拟集成电路 - 其他类型：POWER SUPPLY SUPPORT CIRCUITJESD-30 代码：S-PDSO-G10
JESD-609代码：e3长度：3 mm
湿度敏感等级：1信道数量：1
功能数量：1端子数量：10
最高工作温度：85 °C最低工作温度：-40 °C
封装主体材料：PLASTIC/EPOXY封装代码：TSSOP
封装等效代码：TSSOP10,.19,20封装形状：SQUARE
封装形式：SMALL OUTLINE, THIN PROFILE, SHRINK PITCH峰值回流温度（摄氏度）：225
电源：3.3 V认证状态：Not Qualified
座面最大高度：1.1 mm子类别：Power Management Circuits
最大供电电流 (Isup)：1.8 mA最大供电电压 (Vsup)：5.5 V
最小供电电压 (Vsup)：2.9 V标称供电电压 (Vsup)：3.3 V
表面贴装：YES技术：CMOS
温度等级：INDUSTRIAL端子面层：Matte Tin (Sn)
端子形式：GULL WING端子节距：0.5 mm
端子位置：DUAL处于峰值回流温度下的最长时间：NOT SPECIFIED
宽度：3 mmBase Number Matches：1

LTC2990IMSPBF 数据手册

 浏览型号LTC2990IMSPBF的Datasheet PDF文件第1页浏览型号LTC2990IMSPBF的Datasheet PDF文件第2页浏览型号LTC2990IMSPBF的Datasheet PDF文件第4页浏览型号LTC2990IMSPBF的Datasheet PDF文件第5页浏览型号LTC2990IMSPBF的Datasheet PDF文件第6页浏览型号LTC2990IMSPBF的Datasheet PDF文件第7页 
LTC2990  
elecTrical characTerisTics The l denotes the speAifiAations whiAh applc over the full operating  
temperature range, otherwise speAifiAations are at Tꢀ = ꢁ51C. VCC = 3.3V, unless otherwise noted.  
SYMBOL  
Res  
INL  
PꢀRꢀMETER  
Resolution (No Missing Codes)  
Integral Nonlinearity  
CONDꢂTꢂONS  
(Note 2)  
MꢂN  
14  
TYP  
MꢀX  
UNꢂTS  
Bits  
l
l
2.9V ≤ V ≤ 5.5V, V  
= 1.5V  
CC  
IN(CM)  
(Note 2)  
Single-Ended  
Differential  
–2  
–2  
2
2
LSB  
LSB  
C
V1 Through V4 Input Sampling  
Capacitance  
V1 Through V4 Input Average Sampling  
Current  
(Note 2)  
0.35  
0.6  
pF  
µA  
nA  
IN  
I
I
0V ≤ V ≤ 3V (Note 2)  
N
IN(AVG)  
DC_LEAK(VIN)  
l
V1 Through V4 Input Leakage Current  
0V ≤ V ≤ V  
–10  
10  
N
CC  
Measurement Delac  
, T , T  
V1, V2, V3, V4  
l
l
l
l
l
T
Per Configured Temperature Measurement (Note 2)  
37  
1.2  
1.2  
1.2  
46  
1.5  
1.5  
1.5  
55  
1.8  
1.8  
1.8  
167  
ms  
ms  
ms  
ms  
ms  
INT R1 R2  
Single-Ended Voltage Measurement  
Differential Voltage Measurement  
(Note 2) Per Voltage, Two Minimum  
V1 – V2, V3 – V4  
(Note 2)  
(Note 2)  
(Note 2)  
V
V
Measurement  
CC  
CC  
Max Delay  
Mode[4:0] = 11101, T , T , T , V  
INT R1 R2 CC  
V±, V3 Output (Remote Diode Mode Onlc)  
l
l
I
Output Current  
Output Voltage  
Remote Diode Mode  
260  
350  
V
CC  
µA  
V
OUT  
V
0
OUT  
ꢁ
ꢂ C ꢂnterfaAe  
l
l
l
l
l
l
l
V
ADR0, ADR1 Input Low Threshold Voltage Falling  
ADR0, ADR1 Input High Threshold Voltage Rising  
0.3 • V  
V
V
V
V
V
ADR(L)  
CC  
CC  
V
0.7 • V  
0.7 • V  
ADR(H)  
CC  
V
V
V
SDA Low Level Maximum Voltage  
Maximum Low Level Input Voltage  
Minimum High Level Input Voltage  
SDA, SCL Input Current  
I = –3mA, V = 2.9V to 5.5V  
SDA and SCL Pins  
SDA and SCL Pins  
0.4  
0.3 • V  
OL1  
O
CC  
IL  
IH  
CC  
I
I
0 < V  
,
< V  
CC  
1
1
µA  
µA  
SDAI,SCLI  
SDA SCL  
Maximum ADR0, ADR1 Input Current  
ADR0 or ADR1 Tied to V or GND  
CC  
ADR(MAX)  
ꢁ
ꢂ C Timing (Note ꢁ)  
f
t
t
t
Maximum SCL Clock Frequency  
Minimum SCL Low Period  
Minimum SCL High Period  
Minimum Bus Free Time Between Stop/  
Start Condition  
400  
kHz  
µs  
ns  
SCL(MAX)  
LOW  
1.3  
600  
1.3  
HIGH  
µs  
BUF(MIN)  
t
Minimum Hold Time After (Repeated)  
Start Condition  
Minimum Repeated Start Condition Set-Up  
Time  
600  
600  
ns  
ns  
HD,STA(MIN)  
SU,STA(MIN)  
t
t
t
t
t
t
Minimum Stop Condition Set-Up Time  
Minimum Data Hold Time Input  
Minimum Data Hold Time Output  
Minimum Data Set-Up Time Input  
Maximum Suppressed Spike Pulse Width  
SCL, SDA Input Capacitance  
600  
0
900  
100  
250  
10  
ns  
ns  
ns  
ns  
ns  
pF  
SU,STO(MIN)  
HD,DATI(MIN)  
HD,DATO(MIN)  
SU,DAT(MIN)  
SP(MAX)  
300  
50  
C
X
Note ±: Stresses beyond those listed under Absolute Maximum Ratings  
may cause permanent damage to the device. Exposure to any Absolute  
Maximum Rating condition for extended periods may affect device  
reliability and lifetime.  
Note 4: Trimmed to an ideality factor of 1.004 at 25°C. Remote diode  
temperature drift (TUE) verified at diode voltages corresponding to  
the temperature extremes with the LTC2990 at 25°C. Remote diode  
temperature drift (TUE) guaranteed by characterization over the LTC2990  
operating temperature range.  
Note ꢁ: Guaranteed by design and not subject to test.  
Note 3: Integral nonlinearity is defined as the deviation of a code from a  
straight line passing through the actual endpoints of the transfer curve.  
The deviation is measured from the center of the quantization band.  
2990f  
ꢂ
1234567...24

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