Datasheet > LQM18NN1R8K00#

LQM18NN1R8K00#

更新时间： 2023-09-03 20:28:20

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LQM18NN1R8K00# 数据手册

Reference Only

Spec No. JELF243B-0003S-01

P.2/10

6. Electrical Performance

No.

Item

Specification

Test Method

6.1 Inductance

Inductance shall meet item 3.

Measuring Equipment:

KEYSIGHT 4291A or equivalent (1mA)

Measuring Frequency:

6.2

Q shall meet item 3.

50MHz / 47nH to 82nH

25MHz / 100nH to 820nH

10MHz / 1.0µH to 2.2µH

6.3 DC

Resistance

DC Resistance shall meet item 3.

Measuring Equipment: Digital multi meter

Digital multi meter

(TR6846 or equivalent)

terminal1

terminal2

DC resistance shall be measured after

putting chip coil between the terminal 2

under the condition of opening between

a and b.

Every measurement the terminal 1 shall

be shorted between a and b when

changing chip coil.

6.4 Self Resonant

Frequency (S.R.F)

6.5 Rated Current

S.R.F shall meet item 3.

Measuring Equipment:

Agilent 4291A or equivalent (1mA)

The rated current is applied.

Self temperature rise shall be

limited to 25°C max.

Inductance Change: within ±10%

7. Mechanical Performance

No.

Item

Specification

Chip coil shall not be damaged after

tested as follows.

Test Method

7.1 Shear Test

Applied Direction

Chip Coil

Substrate

Force: 10N

Hold Duration: 5s±1s

Applied Direction: Parallel to PCB

Substrate: Glass-epoxy substrate

7.2 Bending Test

Chip coil shall not be damaged after

tested as follows.

(100mm×40mm×1.6mm)

Pressure jig

R340

Deflection

Product

(in mm)

Speed of Applying Force: 1mm / s

Deflection: 2mm

Hold Duration: 30 s

7.3 Vibration

Appearance: No damage

Oscillation Frequency :

Inductance Change: within ±10%

10Hz to 55Hz to 10Hz for 1 min

Total Amplitude: 1.5mm

Testing Time:

A period of 2 h in each of 3 mutually

perpendicular directions.

MURATA MFG.CO., LTD

123 4 5 6 7...9

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