Spec No.: JELF243B_9101M-01
P12/12
12.! Note
(1) Please make sure that your product has been evaluated in view of your specifications with our product being
mounted to your product.
(2) You are requested not to use our product deviating from the reference specifications.
(3) The contents of this reference specification are subject to change without advance notice.
Please approve our product specifications or transact the approval sheet for product specifications
before ordering.
Appendix
Electrical performance: Measuring method for inductance/Q (Q measurement is applicable only when the Q value is included
in the rating table.)
Perform measurement using the method described below. (Perform correction for the error deriving from the measuring
terminal.)
(1) Residual elements and stray elements of the measuring terminal can be expressed by the F parameter for the 2-pole
terminal as shown in the figure below.
(2) The product's impedance value (Zx) and measured impedance value (Zm) can be expressed as shown below, by using
the respective current and voltage for input/output.
V1
I1
V2
I2
Zm=
Zx=
(3) Thus, the relationship between the product's impedance value (Zx) and measured impedance value (Zm) is as follows.
Here,
α = D/A = 1
β = B/D = Zsm - (1 - Yom Zsm) Zss
Γ = C/A = Yom
Zm-β
Zx=α
1-ZmΓ
Zsm: measured impedance of short chip
Zss: residual impedance of short chip (0 nH)
Yom: measured admittance when measuring
terminal is open
(4) Calculate inductance Lx and Qx using the equations shown below.
Im(Zx)
Lx: inductance of chip coil
Qx: Q of chip coil
Lx=
2πf
Im(Zx)
Qx=
f: measuring frequency
Re(Zx)
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