LMH6583
SNOSAP5E –APRIL 2006–REVISED MARCH 2013
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±3.3V Electrical Characteristics (1) (continued)
Unless otherwise specified, typical conditions are: TA = 25°C, AV = +2, VS = ±3.3V, RL = 100Ω; Boldface limits apply at the
temperature extremes.
(2)
(3)
(2)
Symbol
VO
Parameter
Conditions
Min
Typ
±2.2
Max
Units
(7)
Output Voltage Range
RL = ∞
+2.1
V
-2.05
PSRR
ICC
Power Supply Rejection Ratio
Positive Supply Current
Negative Supply Current
Tri State Supply Current
45
98
92
17
dB
mA
mA
mA
RL = ∞
RL = ∞
120
IEE
115
25
RST Pin > 2.0V
Miscellaneous Performance
RIN
CIN
RO
Input Resistance
Non-Inverting
Non-Inverting
Closed Loop, Enabled
Disabled
100
1
kΩ
pF
mΩ
Ω
Input Capacitance
Output Resistance Enabled
Output Resistance Disabled
Input Common Mode Voltage Range
Output Current
300
1300
±1.3
±50
RO
1100
2.0
1450
CMVR
IO
V
Sourcing, VO = 0 V
mA
Digital Control
VIH
VIL
VOH
VOL
TS
Input Voltage High
V
V
Input Voltage Low
Output Voltage High
Output Voltage Low
Setup Time
0.8
>2.2
<0.4
7
V
V
ns
ns
TH
Hold Time
7
(7) This parameter is ensured by design and/or characterization and is not tested in production.
(1)
±5V Electrical Characteristics
Unless otherwise specified, typical conditions are: TA = 25°C, AV = +2, VS = ±5V, RL = 100Ω; Boldface limits apply at the
temperature extremes.
(2)
(3)
(2)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
Frequency Domain Performance
SSBW
LSBW
−3 dB Bandwidth
VOUT = 0.5 VPP
475
VOUT = 2 VPP, RL = 1 kΩ
550
450
100
0.04
0.04
MHz
VOUT = 2 VPP, RL = 150Ω
GF
DG
DP
0.1 dB Gain Flatness
Differential Gain
VOUT = 2 VPP, RL = 150Ω
MHz
%
RL = 150Ω, 3.58 MHz/ 4.43 MHz
RL = 150Ω, 3.58 MHz/ 4.43 MHz
Differential Phase
deg
Time Domain Response
tr
Rise Time
Fall Time
2V Step, 10% to 90%
2V Step, 10% to 90%
2V Step
1.4
1.3
2
ns
ns
tf
OS
SR
ts
Overshoot
Slew Rate
Settling Time
%
(4)
6 VPP, 40% to 60%
1800
7
V/µs
ns
2V Step, VOUT Within 0.5%
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. No ensurance of parametric performance is
indicated in the electrical tables under conditions different than those tested.
(2) Room Temperature limits are 100% production tested at 25°C. Device self heating results in TJ ≥ TA, however, test time is insufficient for
TJto reach steady state conditions. Limits over the operating temperature range are ensured through correlation using Statistical Quality
Control (SQC) methods.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) Slew Rate is the average of the rising and falling edges.
4
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