Datasheet > LM7171QML-SP

LM7171QML-SP

更新时间： 2023-09-03 20:28:15

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德州仪器 - TI		放大器
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超高速、高输出电流、电压反馈放大器

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LM7171QML-SP 数据手册

LM7171QML, LM7171QML-SP

SNOSAR5C –FEBRUARY 2009–REVISED APRIL 2013

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LM7171 (±15) Electrical Characteristics AC Parameters⁽¹⁾⁽²⁾

The following conditions apply, unless otherwise specified.

AC:

T_J= 25°C, V⁺= +15V, V⁻= −15V, V_CM= 0V, and R_L> 1MΩ

Sub-

groups

Symbol

Parameter

Conditions

Notes

Min Max

Units

Slew Rate

Unity-Gain Bandwidth

A_V= 2, V_I= ±2.5V

3nS Rise & Fall time

See⁽³⁾⁽⁴⁾2000

V/µS

GBW

See⁽⁵⁾

170

MHz

(1) Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post

Radiation Limits Table. These parts may be dose rate sensitive in a space environment and demonstrate enhanced low dose rate effect.

Radiation end point limits for the noted parameters are specified only for the conditions as specified in MIL-STD-883, per Test Method

1019, Condition A.

(2) Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post

Radiation Limits Table. Low dose rate testing has been peformed on a wafer-by-wafer basis, per Test Method 1019, Condition D of MIL-

STD-883, with no enhanced low dose rate sensitivity (ELDRS).

(3) See AN00001 for SR test circuit.

(4) Slew Rate measured between ±4V.

(5) See AN00002 for GBW test circuit.

LM7171 (±15) Electrical Characteristics DC Drift Parameters⁽¹⁾⁽²⁾

The following conditions apply, unless otherwise specified.

DC:

Delta calculations performed on QMLV devices at group B , subgroup 5.

T_J= 25°C, V⁺= +15V, V⁻= −15V, V_CM= 0V, and R_L> 1MΩ

Sub-

groups

Symbol

Parameter

Conditions

Notes

Min Max

Units

V_IO

Input Offset Voltage

Input Bias Current

-250 250

-500 500

µV

+I_Bias

-I_Bias

(1) Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post

Radiation Limits Table. These parts may be dose rate sensitive in a space environment and demonstrate enhanced low dose rate effect.

Radiation end point limits for the noted parameters are specified only for the conditions as specified in MIL-STD-883, per Test Method

1019, Condition A.

(2) Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post

Radiation Limits Table. Low dose rate testing has been peformed on a wafer-by-wafer basis, per Test Method 1019, Condition D of MIL-

STD-883, with no enhanced low dose rate sensitivity (ELDRS).

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