LM34
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SNIS161D –MARCH 2000–REVISED JANUARY 2016
6.6 Electrical Characteristics: LM34, LM34C, and LM34D
Unless otherwise noted, these specifications apply: −50°F ≤ TJ ≤ 300°F for the LM34 and LM34A; −40°F ≤ TJ ≤ 230°F for the
LM34C and LM34CA; and +32°F ≤ TJ ≤ 212°F for the LM34D. VS = 5 Vdc and ILOAD = 50 µA in the circuit of Full-Range
Fahrenheit Temperature Sensor; 6 Vdc for LM34 and LM34A for 230°F ≤ TJ ≤ 300°F. These specifications also apply from
5°F to TMAX in the circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F).
LM34
LM34C, LM34D
PARAMETER
CONDITIONS
UNIT
MIN
TYP MAX
MIN TYP MAX
Tested Limit(2)
Design Limit(3)
–2
2
–2
2
TA = 77°F
TA = 0°F
°F
±0.8
±1
±0.8
±1
Tested Limit
Design Limit
–3
–3
3
3
°F
°F
Accuracy, LM34,
LM34C(1)
Tested Limit
Design Limit
–3
–3
3
3
TA = TMAX
TA = TMIN
TA = 77°F
TA = TMAX
TA = TMIN
±1.6
±1.6
±1.6
±1.6
±1.2
±1.8
±1.8
±0.4
10
Tested Limit
Design Limit
–4
–3
4
3
°F
Tested Limit
Design Limit
°F
Tested Limit
Design Limit
Accuracy, LM34D(1)
–4
–4
–1
4
4
1
°F
Tested Limit
Design Limit
°F
Tested Limit
Design Limit
(4)
Nonlinearity
–1.0
9.8
1
°F
±0.6
10
Tested Limit
Design Limit
10.2
Sensor gain (Average
Slope)
9.8
10.2
2.5
mV/°F
mV/mA
mV/mA
mV/V
mV/V
TA = 77°F
0 ≤ IL ≤ 1 mA
Tested Limit
Design Limit
–2.5
2.5
–2.5
±0.4
±0.5
±0.01
±0.02
±0.4
±0.5
±0.01
±0.02
Load regulation(5)
Tested Limit
Design Limit
TMIN ≤ TA ≤ 150°F
–6.0
–0.1
6
–6
6
0 ≤ IL ≤ 1 mA
Tested Limit
Design Limit
0.1
–0.1
0.1
TA = 77°F,
5 V ≤ VS ≤ 30 V
Line regulation(5)
Tested Limit
Design Limit
5 V ≤ VS ≤ 30 V
–0.2
0.2
–0.2
0.2
(1) Accuracy is defined as the error between the output voltage and 10 mV/˚F times the device’s case temperature at specified conditions of
voltage, current, and temperature (expressed in ˚F).
(2) Tested limits are specified and 100% tested in production.
(3) Design limits are specified (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are
not used to calculate outgoing quality levels.
(4) Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the rated
temperature range of the device.
(5) Regulation is measured at constant junction temperature using pulse testing with a low duty cycle. Changes in output due to heating
effects can be computed by multiplying the internal dissipation by the thermal resistance.
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