LM34
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SNIS161D –MARCH 2000–REVISED JANUARY 2016
6.5 Electrical Characteristics: LM34A and LM34CA
Unless otherwise noted, these specifications apply: −50°F ≤ TJ ≤ 300°F for the LM34 and LM34A; −40°F ≤ TJ ≤ 230°F for the
LM34C and LM34CA; and 32°F ≤ TJ ≤ 212°F for the LM34D. VS = 5 Vdc and ILOAD = 50 µA in the circuit of Full-Range
Fahrenheit Temperature Sensor; 6 Vdc for LM34 and LM34A for 230°F ≤ TJ ≤ 300°F. These specifications also apply from
5°F to TMAX in the circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F).
LM34A
LM34CA
PARAMETER
TEST CONDITIONS
UNIT
MIN
TYP
MAX
MIN
TYP MAX
Tested Limit(2)
Design Limit(3)
–1
1
–1
1
TA = 77°F
T A = 0°F
TA = TMAX
TA = TMIN
°F
±0.4
±0.6
±0.4
±0.6
±0.8
±0.8
±0.3
10
Tested Limit
Design Limit
–2
–2
2
2
°F
°F
Accuracy(1)
Tested Limit
Design Limit
–2
–2
2
2
±0.8
Tested Limit
Design Limit
–3
3
°F
±0.8
Tested Limit
Design Limit
(4)
Nonlinearity
–0.7
9.9
0.7
–0.6
0.6
°F
TA = 77°F
TA = 77°F
±0.35
+10
Tested Limit
Design Limit
10.1
Sensor gain (Average
Slope)
+9.9
–1
10.1
1
mV/°F
mV/mA
mV/mA
mV/V
mV/V
Tested Limit
Design Limit
–1
1
TA = 77°F
0 ≤ IL ≤ 1 mA
±0.4
±0.4
±0.5
±0.01
±0.02
Load regulation(5)
Tested Limit
Design Limit
0 ≤ IL ≤ 1 mA
–3
3
–3
3
±0.5
Tested Limit
Design Limit
–0.05
0.05 –0.05
0.05
TA = 77°F
5 V ≤ VS ≤ 30 V
±0.01
±0.02
Line regulation(5)
Tested Limit
Design Limit
5 V ≤ VS ≤ 30 V
–0.1
0.1
–0.1
0.1
(1) Accuracy is defined as the error between the output voltage and 10 mV/°F times the device’s case temperature at specified conditions of
voltage, current, and temperature (expressed in °F).
(2) Tested limits are specified and 100% tested in production.
(3) Design limits are specified (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are
not used to calculate outgoing quality levels.
(4) Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the rated
temperature range of the device.
(5) Regulation is measured at constant junction temperature using pulse testing with a low duty cycle. Changes in output due to heating
effects can be computed by multiplying the internal dissipation by the thermal resistance.
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