Datasheet > LD021A101KAB2A

LD021A101KAB2A

更新时间： 2022-12-29 19:39:39

品牌	Logo	应用领域
京瓷/艾维克斯 - KYOCERA AVX		/
页数	文件大小	规格书
14页	1221K
描述
MLCC Tin/Lead Termination "B" (LD Series)

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LD021A101KAB2A 数据手册

MLCC Tin/Lead Termination “B”

X8R – Speciﬁcations and Test Methods

Parameter/Test

Operating Temperature Range

Capacitance

X8R Speciﬁcation Limits

Measuring Conditions

-55ºC to +150ºC

Within speciﬁed tolerance

Temperature Cycle Chamber

Freq.: 1.0 kHz ± 10%

Voltage: 1.0Vrms ± .2V

≤ 2.5% for ≥ 50V DC rating

≤ 3.5% for 25V DC and 16V DC rating

Dissipation Factor

100,000MΩ or 1000MΩ - μF,

whichever is less

Charge device with rated voltage for

120 ± 5 secs @ room temp/humidity

Insulation Resistance

Charge device with 250% of rated voltage for

1-5 seconds, w/charge and discharge current

limited to 50 mA (max)

Dielectric Strength

No breakdown or visual defects

Note: Charge device with 150% of rated voltage

for 500V devices.

Appearance

Capacitance

No defects

Deﬂection: 2mm

Test Time: 30 seconds

≤ ±12%

Variation

Resistance to

Flexure

Stresses

Dissipation

Factor

Insulation

Resistance

Meets Initial Values (As Above)

≥ Initial Value x 0.3

≥ 95% of each terminal should be covered

Dip device in eutectic solder at 230 ± 5ºC

Solderability

with fresh solder

for 5.0 ± 0.5 seconds

Appearance

No defects, <25% leaching of either end terminal

Capacitance

Variation

Dissipation

Factor

Insulation

Resistance

Dielectric

Strength

≤ ±7.5%

Dip device in eutectic solder at 260ºC for 60

seconds. Store at room temperature for 24 ± 2

hours before measuring electrical properties.

Resistance to

Solder Heat

Meets Initial Values (As Above)

No visual defects

≤ ±7.5%

Appearance

Capacitance

Variation

Step 1: -55ºC ± 2º

30 ± 3 minutes

Step 2: Room Temp

≤ 3 minutes

Dissipation

Factor

Meets Initial Values (As Above)

Step 3: +125ºC ± 2º

Step 4: Room Temp

30 ± 3 minutes

Thermal Shock

Insulation

Resistance

≤ 3 minutes

Dielectric

Strength

Appearance

Repeat for 5 cycles and measure after

24 ± 2 hours at room temperature

Meets Initial Values (As Above)

No visual defects

Capacitance

Variation

≤ ±12.5%

Charge device with 1.5 rated voltage (≤ 10V) in

test chamber set at 150ºC ± 2ºC

for 1000 hours (+48, -0)

Dissipation

Factor

≤ Initial Value x 2.0 (See Above)

≥ Initial Value x 0.3 (See Above)

Load Life

Insulation

Resistance

Remove from test chamber and stabilize at room

temperature for 24 ± 2 hours before measuring.

Dielectric

Strength

Appearance

Meets Initial Values (As Above)

No visual defects

Capacitance

Variation

Dissipation

Factor

Insulation

Resistance

Store in a test chamber set at 85ºC ± 2ºC/ 85% ±

5% relative humidity for 1000 hours

≤ ±12.5%

(+48, -0) with rated voltage applied.

≤ Initial Value x 2.0 (See Above)

≥ Initial Value x 0.3 (See Above)

Load

Humidity

Remove from chamber and stabilize at room

temperature and humidity for

24 ± 2 hours before measuring.

Dielectric

Strength

Meets Initial Values (As Above)

112916

1...3 4 567 8 9...14

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