Industrial Temperature
K4F660412D,K4F640412D
CMOS DRAM
CAPACITANCE (TA=25°C, VCC=3.3V, f=1MHz)
Parameter
Input capacitance [A0 ~ A12]
Symbol
CIN1
Min
Max
Units
pF
-
-
-
5
7
7
Input capacitance [RAS, CAS , W, OE]
Output capacitance [DQ0 - DQ3]
CIN2
pF
CDQ
pF
AC CHARACTERISTICS (-40°C£TA£85°C, See note 2)
Test condition : VCC=3.3V±0.3V, Vih/Vil=2.2/0.7V, Voh/Vol=2.0/0.8V
-45
-50
-60
Parameter
Symbol
Units
Note
Min
80
Max
Min
90
Max
Min
110
153
Max
Random read or write cycle time
Read-modify-write cycle time
Access time fromRAS
tRC
ns
ns
115
133
tRWC
tRAC
tCAC
tAA
45
12
23
50
13
25
60
15
30
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
3,4,10
3,4,5
3,10
3
Access time fromCAS
Access time from column address
CAS to output in Low-Z
0
0
0
0
tCLZ
tOFF
tT
Output buffer turn-off delay
Transition time (rise and fall)
RAS precharge time
13
50
0
13
50
0
13
50
6
1
1
1
2
25
45
12
45
12
18
13
5
30
50
13
50
13
20
15
5
40
60
15
60
15
20
15
5
tR P
RAS pulse width
10K
10K
10K
tRAS
tRSH
tCSH
tCAS
tRCD
tRAD
tCRP
tASR
tRAH
tASC
tCAH
tRAL
tRCS
tRCH
tRRH
tWCH
tW P
RAS hold time
CAS hold time
CAS pulse width
10K
33
10K
37
10K
45
RAS to CAS delay time
4
RAS to column address delay time
CAS to RAS precharge time
Row address set-up time
Row address hold time
22
25
30
10
0
0
0
8
10
0
10
0
Column address set-up time
Column address hold time
Column address to RAS lead time
Read command set-up time
Read command hold time referenced to CAS
Read command hold time referenced to RAS
Write command hold time
Write command pulse width
Write command toRAS lead time
Write command toCAS lead time
Data set-up time
0
8
10
25
0
10
30
0
23
0
0
0
0
8
8
0
0
0
8
10
10
15
13
0
10
10
15
15
0
8
13
12
0
tRWL
tCWL
tD S
9
9
Data hold time
tDH
10
10
10