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IDT74FCT543AD PDF预览

IDT74FCT543AD

更新时间: 2024-09-24 23:10:19
品牌 Logo 应用领域
艾迪悌 - IDT /
页数 文件大小 规格书
7页 75K
描述
FAST CMOS OCTAL LATCHED TRANSCEIVER

IDT74FCT543AD 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:DIP包装说明:DIP, DIP24,.3
针数:24Reach Compliance Code:not_compliant
风险等级:5.63其他特性:MASTER CONTROL FOR LATCH AND OUTPUT ENABLES IN EACH DIRECTION
控制类型:INDEPENDENT CONTROL计数方向:BIDIRECTIONAL
系列:FCTJESD-30 代码:R-GDIP-T24
JESD-609代码:e0长度:32.004 mm
负载电容(CL):50 pF逻辑集成电路类型:REGISTERED BUS TRANSCEIVER
最大I(ol):0.064 A位数:8
功能数量:1端口数量:2
端子数量:24最高工作温度:70 °C
最低工作温度:输出特性:3-STATE
输出极性:TRUE封装主体材料:CERAMIC, GLASS-SEALED
封装代码:DIP封装等效代码:DIP24,.3
封装形状:RECTANGULAR封装形式:IN-LINE
峰值回流温度(摄氏度):NOT SPECIFIED电源:5 V
Prop。Delay @ Nom-Sup:6.5 ns传播延迟(tpd):8 ns
认证状态:Not Qualified座面最大高度:5.08 mm
子类别:Bus Driver/Transceivers最大供电电压 (Vsup):5.25 V
最小供电电压 (Vsup):4.75 V标称供电电压 (Vsup):5 V
表面贴装:NO技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
翻译:N/A宽度:7.62 mm
Base Number Matches:1

IDT74FCT543AD 数据手册

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IDT54/74FCT543  
IDT54/74FCT543A  
IDT54/74FCT543C  
FAST CMOS  
OCTAL LATCHED  
TRANSCEIVER  
Integrated Device Technology, Inc.  
FEATURES:  
DESCRIPTION:  
• IDT54/74FCT543 equivalent to FAST speed  
IDT54/74FCT543A 25% faster than FAST  
• IDT54/74FCT543C 40% faster than FAST  
• Equivalent to FAST output drive over full temperature  
and voltage supply extremes  
• IOL = 64mA (commercial), 48mA (military)  
• Separate controls for data flow in each direction  
• Back-to-back latches for storage  
• CMOS power levels (1mW typ. static)  
• Substantially lower input current levels than FAST  
(5µA max.)  
• TTL input and output level compatible  
• CMOS output level compatible  
The IDT54/74FCT543/A/C is a non-inverting octal trans-  
ceiver built using an advanced dual metal CMOS technology.  
These devices contain two sets of eight D-type latches with  
separate input and output controls for each set. For data flow  
fromAtoB, forexample, theA-to-BEnable(CEAB)inputmust  
be LOW in order to enter data from A0–A7 or to take data from  
B0–B7, as indicated in the Function Table. With CEAB LOW,  
a LOW signal on the A-to-B Latch Enable (LEAB) input makes  
the A-to-B latches transparent; a subsequent LOW-to-HIGH  
transition of the LEAB signal puts the A latches in the storage  
mode and their outputs no longer change with the A inputs.  
With CEAB and OEAB both LOW, the 3-state B output buffers  
are active and reflect the data present at the output of the A  
latches. Control of data from B to A is similar, but uses the  
CEBA, LEBA and OEBA inputs.  
• Product available in Radiation Tolerant and Radiation  
Enhanced versions  
• Military product compliant to MIL-STD-883, Class B  
FUNCTIONAL BLOCK DIAGRAMS  
DETAIL A  
B0  
D
Q
LE  
Q
D
A0  
LE  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
B1  
B2  
B3  
B4  
B5  
DETAIL A x 7  
B6  
B7  
OEBA  
OEAB  
CEAB  
CEBA  
LEBA  
LEAB  
2614 drw 01  
The IDT logo is a registered trademark of Integrated Device Technology, Inc.  
FAST is a registered trademark of National Semiconductor Co.  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
MAY 1992  
1992 Integrated Device Technology, Inc.  
7.17  
DSC-4602/3  
1

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